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T. Mogami · SciRah

Researcher profile · Semantic Scholar

T. Mogami

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T. Mogami — researcher profile on SciRah

h-index: 20
Works: 145
Citations: 1,592

Most-cited papers

A study of the threshold voltage variation for ultra-small bulk and SOI CMOS
K. Takeuchi, R. Koh, T. Mogami
200196 citations
Semantic Scholar
Low-loss silicon wire waveguides for optical integrated circuits
T. Horikawa, D. Shimura, T. Mogami
201676 citations
Semantic Scholar
A 300-mm Silicon Photonics Platform for Large-Scale Device Integration
T. Horikawa, D. Shimura, H. Okayama, Seok-Hwan Jeong +7 more
2018IEEE Journal of Selected Topics in Quantum Electronics74 citations
Semantic Scholar
Sub-10-nm planar-bulk-CMOS devices using lateral junction control
H. Wakabayashi, S. Yamagami, N. Ikezawa, A. Ogura +6 more
2003IEEE International Electron Devices Meeting 200371 citations
Semantic Scholar
A dual-metal gate CMOS technology using nitrogen-concentration-controlled TiNx film
H. Wakabayashi, Y. Saito, K. Takeuchi, T. Mogami +1 more
200152 citations
Semantic Scholar
Origin of characteristic variability in metal-oxide-semiconductor field-effect transistors revealed by three-dimensional atom imaging
H. Takamizawa, Y. Shimizu, K. Inoue, T. Toyama +7 more
201140 citations
Semantic Scholar
Sub-50-nm physical gate length CMOS technology and beyond using steep halo
H. Wakabayashi, M. Ueki, M. Narihiro, T. Fukai +7 more
200236 citations
Semantic Scholar
High mobility MISFET with low trapped charge in HfSiO films
A. Morioka, H. Watanabe, M. Miyamura, T. Tatsumi +8 more
20032003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407)33 citations
Semantic Scholar
Analysis and prospect of local variability of drain current in scaled MOSFETs by a new decomposition method
T. Tsunomura, Ashok Kumar, T. Mizutani, Cheng-Kuo Lee +7 more
2010Symposium on VLSI Technology30 citations
Semantic Scholar
Correlation between threshold voltage and channel dopant concentration in negative-type metal-oxide-semiconductor field-effect transistors studied by atom probe tomography
H. Takamizawa, Y. Shimizu, K. Inoue, T. Toyama +10 more
201225 citations
Semantic Scholar
Impact of carbon coimplantation on boron behavior in silicon: Carbon–boron coclustering and suppression of boron diffusion
Y. Shimizu, H. Takamizawa, K. Inoue, T. Toyama +8 more
201124 citations
Semantic Scholar
The impacts of fabrication error in Si wire-waveguides on spectral variation of coupled resonator optical waveguides
T. Horikawa, D. Shimura, Seok-Hwan Jeong, M. Tokushima +2 more
201620 citations
Semantic Scholar
A redundant multi-valued logic for 10 Gb/s CMOS demultiplexer IC
A. Tanabe, Y. Nakahara, A. Furukawa, T. Mogami
20012001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177)20 citations
Semantic Scholar
Suppression of DIBL and current-onset voltage variability in intrinsic channel fully depleted SOI MOSFETs
T. Hiramoto, T. Mizutani, Ashok Kumar, A. Nishida +5 more
2010International SOI Conference19 citations
Semantic Scholar
A highly manufacturable low power and high speed HfSiO CMOS FET with dual poly-Si gate electrodes
T. Iwamoto, T. Ogura, M. Terai, H. Watanabe +12 more
2003IEEE International Electron Devices Meeting 200317 citations
Semantic Scholar
Dependence of electrical properties on nitrogen profile in ultrathin oxynitride gate dielectrics formed by using oxygen and nitrogen radicals
Koji Watanabe, T. Tatsumi, M. Togo, T. Mogami
200115 citations Open access
Semantic Scholar
1.2 Tbps/cm2 Enabling Silicon Photonics IC Technology Based on 40-nm Generation Platform
T. Mogami, T. Horikawa, K. Kinoshita, Y. Hagihara +16 more
2018Journal of Lightwave Technology14 citations
Semantic Scholar
High-performance optical waveguide devices using 300mm Si photonics platform
T. Mogami, T. Horikawa, K. Kinoshita, H. Sasaki +2 more
201614 citations
Semantic Scholar
Origin of Larger Drain Current Variability in N-Type Field-Effect Transistors Analyzed by Variability Decomposition Method
T. Tsunomura, Anil Kumar, T. Mizutani, A. Nishida +6 more
201014 citations Open access
Semantic Scholar
High precision Si waveguide devices designed for 1.31μm and 1.55μm wavelengths on 300mm-SOI
D. Shimura, T. Horikawa, H. Okayama, Seok-Hwan Jeong +3 more
2014International Conference on Group IV Photonics13 citations
Semantic Scholar
Direct Observation of Fluctuations in the Number and Individual Electronic Properties of Interface Traps in Nanoscale Metal–Oxide–Semiconductor Field-Effect Transistors
T. Tsuchiya, Y. Mori, Yuta Morimura, T. Mogami +1 more
201013 citations
Semantic Scholar
Process control and monitoring in device fabrication for optical interconnection using silicon photonics technology
T. Horikawa, D. Shimura, Seok-Hwan Jeong, M. Tokushima +2 more
20152015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)12 citations
Semantic Scholar
High-Temperature Properties of Drain Current Variability in Scaled Field-Effect Transistors Analyzed by Decomposition Method
T. Tsunomura, Anil Kumar, T. Mizutani, A. Nishida +6 more
201112 citations Open access
Semantic Scholar
Resonant Wavelength Variation Modelling for Microring Resonators based on Fabrication Deviation Analysis
T. Horikawa, D. Shimura, Hiroyuki Takahashi, J. Ushida +6 more
2017European Conference on Optical Communication11 citations
Semantic Scholar
Evaluation of MOSFET C-V curve variation using test structure for charge-based capacitance measurement
K. Tsuji, K. Terada, Ryota Kikuchi, T. Tsunomura +2 more
20112011 IEEE ICMTS International Conference on Microelectronic Test Structures11 citations
Semantic Scholar
Three-Dimensional Dopant Characterization of Actual Metal–Oxide–Semiconductor Devices of 65 nm Node by Atom Probe Tomography
K. Inoue, H. Takamizawa, Y. Shimizu, F. Yano +11 more
201310 citations Open access
Semantic Scholar
Channel Dopant Distribution in Metal–Oxide–Semiconductor Field-Effect Transistors Analyzed by Laser-Assisted Atom Probe Tomography
H. Takamizawa, K. Inoue, Y. Shimizu, T. Toyama +5 more
201110 citations
Semantic Scholar
Performance of new E-beam lithography system JBX-9300FS
H. Takemura, H. Ohki, H. Nakazawa, Y. Nakagawa +5 more
200010 citations
Semantic Scholar
Study on the effects of the Si capping layer growth conditions on the leakage current of Ge photodetector
S. Okumura, K. Kinoshita, J. Fujikata, T. Simoyama +5 more
20179 citations Open access
Semantic Scholar
Suppression of VT variability degradation induced by NBTI with RDF control
T. Tsunomura, J. Nishimura, Ashok Kumar, A. Nishida +4 more
2011Symposium on VLSI Technology9 citations
Semantic Scholar
On-chip sine-wave noise generator for analog IP noise tolerance measurements
M. Soda, Yoji Bando, S. Takaya, Toru Ohkawa +5 more
20102010 IEEE Asian Solid-State Circuits Conference9 citations
Semantic Scholar
Electrical properties of 1.5-nm SiON gate-dielectric using radical oxygen and radical nitrogen
M. Togo, K. Watanabe, Toyoji Yamamoto, N. Ikarashi +3 more
20029 citations
Semantic Scholar
Challenges for sub-10 nm CMOS devices
T. Mogami, H. Wakabayashi
20062006 International Workshop on Nano CMOS8 citations
Semantic Scholar
Controlling base-SiO/sub 2/ density of low-leakage 1.6 nm gate-SiON for high-performance and highly reliable n/pFETs
M. Togo, K. Watanabe, M. Terai, S. Kimura +4 more
20012001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184)7 citations
Semantic Scholar
Extraction of SOI thickness deviation based on resonant wavelength analysis for silicon photonics devices
T. Horikawa, D. Shimura, Hiroyuki Takahashi, J. Ushida +6 more
2017IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference6 citations
Semantic Scholar
Advanced devices and packaging of Si-photonics-based optical transceiver for optical interconnection
K. Kurata, K. Yashiki, Junichi Fujikata, T. Horikawa +14 more
2017International Electron Devices Meeting6 citations
Semantic Scholar
Device structure and fabrication process for silicon spin qubit realizing process-variation-robust SWAP gate operation
H. Asai, S. Iizuka, T. Mogami, J. Hattori +5 more
2023Japanese Journal of Applied Physics5 citations Open access
Semantic Scholar
High density optical and electrical interfaces for chip-scale silicon photonic receiver
K. Takemura, Y. Ibusuki, A. Ukita, M. Kurihara +8 more
2017International Conference on Electronics Packaging5 citations
Semantic Scholar
Ultralow resistance W/poly-Si gate CMOS technology using amorphous-Si/TiN buffer layer
H. Wakabayashi, Toyoji Yamamoto, K. Yoshida, E. Soda +3 more
20025 citations
Semantic Scholar
Low-Leakage and Highly Reliable 1.5 nm SiON Gate Dielectric Using Radical Oxynitridation for Sub-0.1 μm CMOS
M. Togo, Koji Watanabe, Toyoji Yamamoto, N. Ikarashi +3 more
20015 citations
Semantic Scholar
A 300mm Si photonics platform for optical interconnection
T. Mogami, T. Horikawa, K. Kinoshita, H. Sasaki +2 more
20152015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)4 citations
Semantic Scholar
A 300mm Si photonics platform for multi-applications
T. Mogami, T. Horikawa, K. Kinoshita, H. Sasaki +2 more
2015Opto-Electronics and Communications Conference4 citations
Semantic Scholar
Effect of channel dopant uniformity on MOSFET threshold voltage variability
K. Terada, Kazuhiko Sanai, K. Tsuji, T. Tsunomura +2 more
20124 citations
Semantic Scholar
Process Condition Dependence of Random V T Variability in NFETs and PFETs
T. Tsunomura, A. Nishida, Kiyoshi Takeuchi, S. Inaba +4 more
20094 citations
Semantic Scholar
Improved sub-10-nm CMOS devices with elevated source/drain extensions by tunneling si-selective-epitaxial-growth
H. Wakabayashi, T. Tatsumi, N. Ikarashi, M. Oshida +7 more
2005IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.4 citations
Semantic Scholar
Oxynitridation using radical-oxygen and -nitrogen for high-performance and highly reliable n/pFETs
M. Togo, K. Watanabe, M. Terai, S. Kimura +3 more
20024 citations
Semantic Scholar
Barrier-metal-free (BMF), Cu dual-damascene interconnects with Cu-epi-contacts buried in anti-diffusive, low-k organic film
M. Tada, Hiroto Ohtake, Y. Harada, M. Hiroi +9 more
20012001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184)4 citations
Semantic Scholar
Intra-Level Mix-and-Match Lithography Process for Fabricating Sub-100-nm Complementary Metal-Oxide-Semiconductor Devices using the JBX-9300FS Point-Electron-Beam System
Mitsuru Narihiro, H. Wakabayashi, M. Ueki, K. Arai +3 more
20004 citations Open access
Semantic Scholar
High-performance Si optical modulator with strained p-SiGe layer and its application to 25 Gbps optical transceiver
J. Fujikata, K. Kinoshita, Jaehoon Han, T. Horikawa +8 more
2017International Conference on Group IV Photonics3 citations
Semantic Scholar
Electrical estimation of channel dopant uniformity using test MOSFET array
K. Terada, Kazuhiko Sanai, K. Tsuji, T. Tsunomura +2 more
20112011 IEEE ICMTS International Conference on Microelectronic Test Structures3 citations
Semantic Scholar

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