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M. Terai · SciRah

Researcher profile · Semantic Scholar

M. Terai

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M. Terai — researcher profile on SciRah

h-index: 12
Works: 37
Citations: 348

Most-cited papers

Resistance Controllability of $\hbox{Ta}_{2} \hbox{O}_{5}/\hbox{TiO}_{2}$ Stack ReRAM for Low-Voltage and Multilevel Operation
M. Terai, Y. Sakotsubo, S. Kotsuji, H. Hada
2010IEEE Electron Device Letters62 citations
Semantic Scholar
Memory-State Dependence of Random Telegraph Noise of $ \hbox{Ta}_{2}\hbox{O}_{5}/\hbox{TiO}_{2}$ Stack ReRAM
M. Terai, Y. Sakotsubo, Y. Saito, S. Kotsuji +1 more
2010IEEE Electron Device Letters33 citations
Semantic Scholar
Effect of bottom electrode of ReRAM with Ta2O5/TiO2 stack on RTN and retention
M. Terai, Y. Sakotsubo, Y. Saito, S. Kotsuji +1 more
2009International Electron Devices Meeting30 citations
Semantic Scholar
Highly scalable nonvolatile TiOx/TaSiOy solid-electrolyte crossbar switch integrated in local interconnect for low power reconfigurable logic
M. Tada, T. Sakamoto, Y. Tsuji, N. Banno +9 more
2009International Electron Devices Meeting25 citations
Semantic Scholar
Physical Model for Reset State of Ta2O5/TiO2-Stacked Resistance Random Access Memory
Y. Sakotsubo, M. Terai, S. Kotsuji, T. Sakamoto +1 more
201021 citations Open access
Semantic Scholar
A highly manufacturable low power and high speed HfSiO CMOS FET with dual poly-Si gate electrodes
T. Iwamoto, T. Ogura, M. Terai, H. Watanabe +12 more
2003IEEE International Electron Devices Meeting 200317 citations
Semantic Scholar
Effect of Nitrogen Profile and Fluorine Incorporation on Negative-Bias Temperature Instability of Ultrathin Plasma-Nitrided SiON MOSFETs
M. Terai, Koji Watanabe, S. Fujieda
2007IEEE Transactions on Electron Devices16 citations
Semantic Scholar
A 65 nm-node CMOS technology with highly reliable triple gate oxide suitable for power-considered system-on-a-chip
T. Fukai, Y. Nakahara, M. Terai, S. Koyama +16 more
20032003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407)16 citations
Semantic Scholar
A new approach for improving operating margin of unipolar ReRAM using local minimu m of reset voltage
Y. Sakotsubo, M. Terai, S. Kotsuji, Y. Saito +3 more
2010Symposium on VLSI Technology15 citations
Semantic Scholar
1.2 nm HfSiON/SiON Stacked Gate Insulators for 65-nm-Node MISFETs
M. Saitoh, M. Terai, N. Ikarashi, Heiji Watanabe +7 more
200514 citations Open access
Semantic Scholar
Highly reliable HfSiON CMOSFET with phase controlled NiSi (NFET) and Ni/sub 3/Si (PFET) FUSI gate electrode
M. Terai, Kensuke Takahashi, K. Manabe, T. Hase +5 more
2005Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005.13 citations
Semantic Scholar
Effect of ReRAM-stack asymmetry on read disturb immunity
M. Terai, S. Kotsuji, H. Hada, N. Iguchi +2 more
2009IEEE International Reliability Physics Symposium12 citations
Semantic Scholar
Influence of Charge Traps within HfSiON Bulk on Positive and Negative Bias Temperature Instability of HfSiON Gate Stacks
S. Fujieda, S. Kotsuji, A. Morioka, M. Terai +1 more
200511 citations Open access
Semantic Scholar
High thermal robust ReRAM with a new method for suppressing read disturb
M. Terai, M. Saitoh, T. Nagumo, Y. Sakotsubo +3 more
2011Symposium on VLSI Technology8 citations
Semantic Scholar
Breakdown Mechanisms and Lifetime Prediction for 90-nm-Node Low-Power HfSiON/SiO2 CMOSFETs
M. Terai, Y. Yabe, S. Fujieda, A. Morioka +6 more
20048 citations
Semantic Scholar
Controlling base-SiO/sub 2/ density of low-leakage 1.6 nm gate-SiON for high-performance and highly reliable n/pFETs
M. Togo, K. Watanabe, M. Terai, S. Kimura +4 more
20012001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184)7 citations
Semantic Scholar
A 540 K-transistor CMOS variable-track masterslice
Y. Kuramitsu, M. Ueda, T. Arakawa, M. Terai +1 more
19876 citations
Semantic Scholar
Oxynitridation using radical-oxygen and -nitrogen for high-performance and highly reliable n/pFETs
M. Togo, K. Watanabe, M. Terai, S. Kimura +3 more
20024 citations
Semantic Scholar
A basic-cell buffer 440K-transistor CMOS masterslice
T. Arakawa, M. Ueda, Y. Saito, T. Fujimura +4 more
19861986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers4 citations
Semantic Scholar
Physical model for reset state of Ta 2 O 5 /TiO 2 stacked ReRAM
Y. Sakotsubo, M. Terai, S. Kotsuji, T. Sakamoto +1 more
20093 citations
Semantic Scholar
New degradation mode of program disturb immunity of sub 90-nm node split-gate SONOS memory
Y. Tsuji, M. Terai, S. Fujieda, Koichi Ando
2008IEEE International Reliability Physics Symposium3 citations
Semantic Scholar
Impact of Crystalline Phase of Ni-FUSI Gate Electrode on Bias Temperature Instability and Gate Dielectric Breakdown of HfSiON MOSFETs
M. Terai, T. Onizawa, Setsu Kotsuji, N. Ikarashi +3 more
2007IEEE Transactions on Electron Devices3 citations
Semantic Scholar
Ultra-uniform threshold voltage in SONOS-type non-volatile memory with novel charge trap layer formed by plasma nitridation
Hiroshi Sunamura, Koji Masuzaki, M. Terai, Setsu Kotsuji +6 more
20062006 21st IEEE Non-Volatile Semiconductor Memory Workshop3 citations
Semantic Scholar
Impact of Nitrogen Profile on Negative-Bias Temperature Instability and CMOS Performance
M. Terai, Toyoji Yamamoto, Koji Watanabe, M. Togo +4 more
20023 citations
Semantic Scholar
Trapped-Hole-Enhanced Erase-Level Shift by FN-Stress Disturb in Sub-90-nm-Node Embedded SONOS Memory
M. Terai, Y. Tsuji, Setsu Kotsuji, S. Fujieda +1 more
2008IEEE Transactions on Electron Devices2 citations
Semantic Scholar
Impact of Crystalline Phase of Ni-Full-Silicide Gate Electrode on TDDB Reliability of HfSiON Gate Stacks
T. Onizawa, M. Terai, A. Toda, M. Oshida +4 more
20062006 IEEE International Reliability Physics Symposium Proceedings2 citations
Semantic Scholar
Improving the quality of sub-1.5-nm-thick oxynitride gate dielectric for FETs with narrow channel and shallow-trench isolation using radical oxygen and nitrogen
M. Togo, K. Watanabe, M. Terai, Toyoji Yamamoto +3 more
20022 citations
Semantic Scholar
Effect of Nitrogen Profile and Fluorine Incorporation on Negative-bias Temperature Instability of Ultrathin Plasma-nitrided SiON MOSFETs
M. Terai, S. Fujieda
20071 citations
Semantic Scholar
Bias Temperature Instability Characterization of Advanced Gate Stacks
S. Fujieda, M. Terai, M. Saitoh, A. Toda +6 more
20071 citations
Semantic Scholar
Impact of Crystalline Phase of Ni-FUSI Gate Electrode on BTI and TDDB Reliability of HfSiON MOSFETs
M. Terai, T. Onizawa, Setsu Kotsuji, A. Toda +2 more
20062006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.1 citations
Semantic Scholar
1.2nm HfSiON/SiON stacked gate insulators for 65nm-node MISFETs
M. Saitoh, N. Ikarashi, Heiji Watanabe, S. Fujieda +12 more
20041 citations
Semantic Scholar
Influences of Traps within HfSiON Bulk on Positive- and Negative- Bias Temperature Instability of HfSiON Gate Stacks
S. Fujieda, S. Kotsuji, A. Morioka, M. Terai +1 more
20041 citations
Semantic Scholar
Effects of Si/Ni Composition Ratio of NixSiy Gate Electrode and Hf/Si Composition Ratio of Hf-Based High-k Insulator on Threshold Voltage Controllability and Mobility of Metal–Oxide–Semiconductor Field-Effect Transistors
M. Terai, T. Hase, K. Shibahara, H. Watanabe
20100 citations
Semantic Scholar
Advanced Gate Stacks with Fully Silicided(FUSI) Gates and High-k Dielectrics for Low Power CMOS
T. Ogura, M. Saitoh, Kensuke Takahashi, K. Manabe +8 more
20060 citations Open access
Semantic Scholar
Low-Power and High-Speed Hf-based gated CMOSFET with Poly-Si Gate Electrode
T. Iwamoto, T. Ogura, M. Terai, A. Morioka +6 more
20060 citations Open access
Semantic Scholar
Low-power and high-speed Hf-based gated cmos fet with dual poly-si gate electrodes
T. Iwamoto, T. Ogura, M. Terai, A. Morioka +6 more
20050 citations
Semantic Scholar
Impact of radical oxynitridation on characteristics and reliability of sub-1.5 nm-thick gate-dielectric FETs with narrow channel and shallow-trench isolation
M. Togo, K. Watanabe, M. Terai, T. Fukai +6 more
2001International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)0 citations
Semantic Scholar

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