Skip to content

Home Search Authors Pakistan News Saved

SciRah

SciRah does not host or store research papers. Results come live from free, official scholarly APIs, and every paper links back to its original source.

Data sources

OpenAlex
Semantic Scholar
Crossref
CORE
arXiv
PubMed

Privacy policy Terms of service

J. Kittl · SciRah

Researcher profile · Semantic Scholar

J. Kittl

Share profile

J. Kittl — researcher profile on SciRah

h-index: 36
Works: 255
Citations: 4,532

Most-cited papers

10×10nm2 Hf/HfOx crossbar resistive RAM with excellent performance, reliability and low-energy operation
B. Govoreanu, G. Kar, Y.-Y. Chen, V. Paraschiv +17 more
2011International Electron Devices Meeting694 citations
Semantic Scholar
Dynamic ‘hour glass’ model for SET and RESET in HfO2 RRAM
R. Degraeve, A. Fantini, S. Clima, B. Govoreanu +11 more
2012Symposium on VLSI Technology98 citations
Semantic Scholar
Semiconductor-metal transition in thin VO2 films grown by ozone based atomic layer deposition
Geert Rampelberg, M. Schaekers, K. Martens, Qi Xie +5 more
201193 citations
Semantic Scholar
Influence of the Cu-Te composition and microstructure on the resistive switching of Cu-Te/Al2O3/Si cells
L. Goux, K. Opsomer, R. Degraeve, R. Muller +5 more
201188 citations Open access
Semantic Scholar
Intrinsic Switching Behavior in HfO2 RRAM by Fast Electrical Measurements on Novel 2R Test Structures
A. Fantini, D. Wouters, R. Degraeve, L. Goux +7 more
20122012 4th IEEE International Memory Workshop66 citations
Semantic Scholar
Influence of Al2O3 crystallization on band offsets at interfaces with Si and TiNx
V. Afanas'ev, M. Houssa, A. Stesmans, C. Merckling +2 more
201165 citations
Semantic Scholar
Intrinsic electron traps in atomic-layer deposited HfO2 insulators
F. Cerbu, O. Madia, D. Andreev, S. Fadida +9 more
201657 citations Open access
Semantic Scholar
A Monte Carlo study of the low resistance state retention of HfOx based resistive switching memory
Shi-Meng Yu, Yang-Yin Chen, Xi-Meng Guan, H. Wong +1 more
201253 citations
Semantic Scholar
The VO2 interface, the metal-insulator transition tunnel junction, and the metal-insulator transition switch On-Off resistance
K. Martens, I. Radu, S. Mertens, X. Shi +11 more
201253 citations
Semantic Scholar
Insights into Ni-filament formation in unipolar-switching Ni/HfO2/TiN resistive random access memory device
Yang-Yin Chen, G. Pourtois, C. Adelmann, L. Goux +6 more
201252 citations
Semantic Scholar
Atomic Layer Deposition of Gd-Doped HfO2 Thin Films
C. Adelmann, H. Tielens, D. Dewulf, A. Hardy +7 more
201052 citations
Semantic Scholar
Semiconducting-like filament formation in TiN/HfO2/TiN resistive switching random access memories
F. De Stefano, M. Houssa, J. Kittl, M. Jurczak +2 more
201249 citations
Semantic Scholar
Roles and Effects of TiN and Pt Electrodes in Resistive-Switching HfO2 Systems
L. Goux, X.-P. Wang, Yang-Yin Chen, L. Pantisano +6 more
201149 citations Open access
Semantic Scholar
Field-driven ultrafast sub-ns programming in W\Al2O3\Ti\CuTe-based 1T1R CBRAM system
L. Goux, K. Sankaran, G. Kar, N. Jossart +13 more
2012Symposium on VLSI Technology46 citations
Semantic Scholar
Towards barrier height modulation in HfO2/TiN by oxygen scavenging - Dielectric defects or metal induced gap states?
L. Pantisano, V. Afanas'ev, S. Cimino, C. Adelmann +5 more
201144 citations
Semantic Scholar
Contact resistivity and Fermi-level pinning in n-type Ge contacts with epitaxial Si-passivation
K. Martens, R. Rooyackers, A. Firrincieli, B. Vincent +11 more
201143 citations
Semantic Scholar
TiNx/HfO2 interface dipole induced by oxygen scavenging
V. Afanas'ev, A. Stesmans, L. Pantisano, S. Cimino +6 more
201141 citations
Semantic Scholar
Modeling Transient Negative Capacitance in Steep-Slope FeFETs
B. Obradovic, T. Rakshit, R. Hatcher, J. Kittl +1 more
2018IEEE Transactions on Electron Devices39 citations Open access
Semantic Scholar
Modeling of Copper Diffusion in Amorphous Aluminum Oxide in CBRAM Memory Stack
K. Sankaran, L. Goux, S. Clima, M. Mees +5 more
201237 citations Open access
Semantic Scholar
Ferroelectric Switching Delay as Cause of Negative Capacitance and the Implications to NCFETs
B. Obradovic, T. Rakshit, R. Hatcher, J. Kittl +1 more
20182018 IEEE Symposium on VLSI Technology35 citations
Semantic Scholar
Nature of the filament formed in HfO2-based resistive random access memory
F. De Stefano, M. Houssa, V. Afanas'ev, J. Kittl +2 more
201335 citations
Semantic Scholar
Study of ohmic contacts to n-type Ge: Snowplow and laser activation
A. Firrincieli, K. Martens, R. Rooyackers, B. Vincent +6 more
201135 citations
Semantic Scholar
On the validity and applicability of models of negative capacitance and implications for MOS applications
J. Kittl, B. Obradovic, D. Reddy, T. Rakshit +2 more
2018Applied Physics Letters32 citations Open access
Semantic Scholar
Next Generation Access (NGA) supply side interventions-An international comparison
E. Ruhle, I. Brusic, J. Kittl, Matthias Ehrler
201132 citations
Semantic Scholar
A novel tensile Si (n) and compressive SiGe (p) dual-channel CMOS FinFET co-integration scheme for 5nm logic applications and beyond
D. Bae, Geumjong Bae, Krishna Kumar Bhuwalka, Seung-Hun Lee +22 more
2016International Electron Devices Meeting31 citations
Semantic Scholar
Impact of bottom electrode and SrxTiyOz film formation on physical and electrical properties of metal-insulator-metal capacitors
M. Pawlak, B. Kaczer, Minsoo P. Kim, M. Popovici +14 more
201128 citations
Semantic Scholar
Impact of crystallization behavior of SrxTiyOZ films on electrical properties of metal-insulator-metal capacitors with TiN electrodes
M. Pawlak, B. Kaczer, Minsoo P. Kim, M. Popovici +14 more
201027 citations
Semantic Scholar
NiO Thin Films Synthesized by Atomic Layer Deposition using Ni(dmamb)2 and Ozone as Precursors
P. Premkumar, M. Toeller, C. Adelmann, J. Meersschaut +11 more
201226 citations
Semantic Scholar
Improved EOT and leakage current for metal-insulator-metal capacitor stacks with rutile TiO2
M. Popovici, Minsoo P. Kim, K. Tomida, J. Swerts +9 more
201126 citations
Semantic Scholar
Thermal-stability optimization of Al2O3/Cu–Te based conductive-bridging random access memory systems
L. Goux, K. Opsomer, A. Franquet, G. Kar +7 more
201323 citations
Semantic Scholar
Switching by Ni Filaments in a HfO2 Matrix: A New Pathway to Improved Unipolar Switching RRAM
Y.-Y. Chen, G. Pourtois, X.-P. Wang, C. Adelmann +9 more
2011International Memory Workshop22 citations
Semantic Scholar
Atomic Layer Deposition of Gadolinium Aluminate using Gd(iPrCp)3, TMA, and O3 or H2O
C. Adelmann, D. Pierreux, J. Swerts, D. Dewulf +11 more
201022 citations
Semantic Scholar
A Multi-Bit Neuromorphic Weight Cell Using Ferroelectric FETs, suitable for SoC Integration
B. Obradovic, T. Rakshit, R. Hatcher, J. Kittl +3 more
2017IEEE Journal of the Electron Devices Society21 citations Open access
Semantic Scholar
A comparative study of the microstructure–dielectric properties of crystalline SrTiO3 ALD films obtained via seed layer approach
M. Popovici, K. Tomida, J. Swerts, P. Favia +11 more
201121 citations
Semantic Scholar
A Variation Robust Inference Engine Based on STT-MRAM with Parallel Read-Out
Yandong Luo, Xiao-Chen Peng, R. Hatcher, T. Rakshit +4 more
2020International Symposium on Circuits and Systems19 citations
Semantic Scholar
Controlled growth of rutile TiO2 by atomic layer deposition on oxidized ruthenium
M. Popovici, J. Swerts, K. Tomida, D. Radisic +14 more
201119 citations
Semantic Scholar
(Invited) Vanadium Oxide as a Memory Material
I. Radu, K. Martens, S. Mertens, C. Adelmann +8 more
201117 citations
Semantic Scholar
Direct physical evidence of mechanisms of leakage and equivalent oxide thickness reduction in metal-insulator-metal capacitors based on RuOx/TiOx/SrxTiyOz/TiN stacks
M. Pawlak, J. Swerts, M. Popovici, B. Kaczer +9 more
201216 citations
Semantic Scholar
Influence of the CuTe composition and microstructure on the resistive switching of CuTe / Al 2 O 3 / Si cells
L. Goux, K. Opsomer, R. Degraeve, R. Müller +5 more
201116 citations
Semantic Scholar
Impact of thermal treatment upon morphology and crystallinity of strontium titanate films deposited by atomic layer deposition
M. Popovici, S. Van Elshocht, N. Menou, P. Favia +14 more
201113 citations
Semantic Scholar
Fast $V_{\rm TH}$ Transients After the Program/Erase of Flash Memory Stacks With High-$k$ Dielectrics
M. Toledano-Luque, R. Degraeve, M. Zahid, B. Kaczer +5 more
2011IEEE Transactions on Electron Devices13 citations
Semantic Scholar
Study of the impact of doping concentration and Schottky barrier height on ohmic contacts to n-type germanium
A. Firrincieli, K. Martens, E. Simoen, C. Claeys +1 more
201312 citations
Semantic Scholar
Enabling 3X nm DRAM: Record low leakage 0.4 nm EOT MIM capacitors with novel stack engineering
M. Pawlak, Mihaela Popovici, J. Swerts, K. Tomida +14 more
2010International Electron Devices Meeting11 citations
Semantic Scholar
Electron barrier height at CuxTe1 − x/Al2O3 interfaces of conducting bridge memory stacks
V. Afanas'ev, F. De Stefano, M. Houssa, A. Stesmans +5 more
201310 citations
Semantic Scholar
(Invited) Plasma Enhanced Atomic Layer Deposited Ruthenium for MIMCAP Applications
J. Swerts, M. Salimullah, M. Popovici, Min-Soo Kim +11 more
201110 citations Open access
Semantic Scholar
Strontium niobate high-k dielectrics: Film deposition and material properties
A. Hardy, S. Van Elshocht, C. Adelmann, J. Kittl +7 more
201010 citations
Semantic Scholar
Non-linear dielectric constant increase with Ti composition in high-k ALD-HfTiOx films after O2 crystallization annealing
K. Tomida, M. Popovici, K. Opsomer, N. Menou +10 more
201010 citations Open access
Semantic Scholar
Inference engine benchmarking across technological platforms from CMOS to RRAM
Xiao-Chen Peng, Minkyu Kim, Xiao-Yu Sun, Shihui Yin +5 more
2019International Symposium on Memory Systems9 citations
Semantic Scholar
Scaled X-bar TiN/HfO2/TiN RRAM cells processed with optimized plasma enhanced atomic layer deposition (PEALD) for TiN electrode
Y.-Y. Chen, L. Goux, L. Pantisano, J. Swerts +15 more
20139 citations
Semantic Scholar
New carbon-based thermal stability improvement technique for NiPtSi used in CMOS technology
C. Ortolland, M. Togo, E. Rosseel, S. Mertens +4 more
20119 citations
Semantic Scholar

Frequent co-authors

Invite them to SciRah by sharing their profile.

M. Jurczak×18
Invite
M. Jurczak — researcher profile on SciRah
L. Altimime×17
Invite
L. Altimime — researcher profile on SciRah
L. Goux×15
Invite
L. Goux — researcher profile on SciRah
D. Wouters×15
Invite
D. Wouters — researcher profile on SciRah

×13

Invite

J. Swerts — researcher profile on SciRah

Invite

H. Bender — researcher profile on SciRah

C. Adelmann×12

Invite

C. Adelmann — researcher profile on SciRah

B. Govoreanu×11

Invite

B. Govoreanu — researcher profile on SciRah

Invite

K. Opsomer — researcher profile on SciRah

S. Van Elshocht×11

Invite

S. Van Elshocht — researcher profile on SciRah

Invite

B. Kaczer — researcher profile on SciRah

Invite

K. Tomida — researcher profile on SciRah