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E. Simoen · SciRah

Researcher profile · Semantic Scholar

E. Simoen

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E. Simoen — researcher profile on SciRah

h-index: 44
Works: 1,352
Citations: 12K

Most-cited papers

Mitigating Dark Current for High-Performance Near-Infrared Organic Photodiodes via Charge Blocking and Defect Passivation.
Wei-Tao Yang, W. Qiu, Epimitheas Georgitzikis, E. Simoen +8 more
2021ACS Applied Materials and Interfaces76 citations
Semantic Scholar
Comparison of Electrical Performance of Co-Integrated Forksheets and Nanosheets Transistors for the 2nm Technological Node and Beyond
R. Ritzenthaler, H. Mertens, G. Eneman, E. Simoen +14 more
2021International Electron Devices Meeting43 citations
Semantic Scholar
Low–Frequency Noise in Vertically Stacked Si n–Channel Nanosheet FETs
Alberto V. de Oliveira, A. Veloso, C. Claeys, N. Horiguchi +1 more
2020IEEE Electron Device Letters24 citations
Semantic Scholar
Analog Figures of Merit of Vertically Stacked Silicon Nanosheets nMOSFETs With Two Different Metal Gates for the Sub-7 nm Technology Node Operating at High Temperatures
V. Silva, W. Perina, J. Martino, E. Simoen +2 more
2021IEEE Transactions on Electron Devices20 citations
Semantic Scholar
Low-Frequency Noise Assessment of Vertically Stacked Si n-Channel Nanosheet FETs With Different Metal Gates
A. Oliveira, A. Veloso, C. Claeys, N. Horiguchi +1 more
2020IEEE Transactions on Electron Devices20 citations
Semantic Scholar
Analog design with Line-TFET device experimental data: from device to circuit level
Walter Gonçalez, E. Simoen, R. Rooyackers, C. Claeys +3 more
2020Semiconductor Science and Technology14 citations Open access
Semantic Scholar
Overview of Bias Temperature Instability in Scaled DRAM Logic for Memory Transistors
B. O'Sullivan, R. Ritzenthaler, E. Litta, E. Simoen +7 more
2020IEEE transactions on device and materials reliability13 citations
Semantic Scholar
Gate dielectric material influence on DC behavior of MO(I)SHEMT devices operating up to 150 °C
Paula Ghedini Der Agopian, G. J. Carmo, J. Martino, E. Simoen +4 more
202111 citations Open access
Semantic Scholar
Low-Frequency Noise Characterization of Germanium n-Channel FinFETs
Alberto V. de Oliveira, D. Xie, H. Arimura, G. Boccardi +4 more
2020IEEE Transactions on Electron Devices11 citations
Semantic Scholar
Electrical Activity of Extended Defects in Relaxed InxGa1−xAs Hetero-Epitaxial Layers
C. Claeys, Po-Chun Hsu, Y. Mols, Han Han +10 more
2020ECS Journal of Solid State Science and Technology11 citations
Semantic Scholar
Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices
Carlos H. S. Coelho, J. Martino, M. Bellodi, E. Simoen +2 more
2021Microelectronics Journal10 citations
Semantic Scholar
Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
B. Cretu, A. Veloso, E. Simoen
2023IEEE Transactions on Electron Devices9 citations Open access
Semantic Scholar
Using the Octagonal Layout Style for MOSFETs to Boost the Device Matching in Ionizing Radiation Environments
V. Peruzzi, W. S. Cruz, G. A. da Silva, E. Simoen +2 more
2020IEEE transactions on device and materials reliability9 citations
Semantic Scholar
Low-Frequency noise investigation of AlGaN/GaN high-electron-mobility transistors
M. H. C. de Andrade, Luis Felipe de Oliveira Bergamim, Braz Baptista, Carlos Roberto Nogueira +4 more
20218 citations
Semantic Scholar
Analog performance of GaN/AlGaN high-electron-mobility transistors
Luis Felipe de Oliveira Bergamim, B. Parvais, E. Simoen, M. H. C. de Andrade
20218 citations
Semantic Scholar
Impact of the Channel Doping on the Low-Frequency Noise of Gate-All-Around Silicon Vertical Nanowire pMOSFETs
E. Simoen, A. Veloso, P. Matagne, C. Claeys
2022Solid-State Electronics7 citations Open access
Semantic Scholar
Low frequency noise performance of horizontal, stacked and vertical silicon nanowire MOSFETs
E. Simoen, Alberto V. de Oliveira, Paula Ghedini Der Agopian, R. Ritzenthaler +5 more
20217 citations
Semantic Scholar
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Hao Chang, Longda Zhou, Hong Yang, Z. Ji +4 more
2021IEEE International Reliability Physics Symposium7 citations
Semantic Scholar
Impact of Dummy Gate Removal and a Silicon Cap on the Low-Frequency Noise Performance of Germanium nFinFETs
D. Xie, E. Simoen, Hai-Feng Chen, H. Arimura +1 more
2020IEEE Transactions on Electron Devices7 citations
Semantic Scholar
Investigation of Defect Characteristics and Carrier Transport Mechanisms in GaN Layers With Different Carbon Doping Concentration
Hongyue Wang, Po-Chun Hsu, Ming Zhao, E. Simoen +2 more
2020IEEE Transactions on Electron Devices7 citations Open access
Semantic Scholar
Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications
K. Kao, C. Godfrin, A. Elsayed, R. Li +5 more
2022IEEE Electron Device Letters6 citations
Semantic Scholar
Defect Characterization in High‐Electron‐Mobility Transistors with Regrown p‐GaN Gate by Low‐Frequency Noise and Deep‐Level Transient Spectroscopy
Po-Chun Hsu, E. Simoen, Hu Liang, B. De Jaeger +3 more
2021Physica Status Solidi (a)6 citations
Semantic Scholar
Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets
B. Cretu, A. Veloso, E. Simoen
2021Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon6 citations
Semantic Scholar
Detailed low frequency noise assessment on GAA NW n-channel FETs
B. Cretu, A. Bordin, E. Simoen, G. Hellings +2 more
20216 citations Open access
Semantic Scholar
From 5G to 6G: will compound semiconductors make the difference?
N. Collaert, A. Alian, A. Banerjee, Vikas Chauhan +21 more
2020IEEE International Conference on Solid-State and Integrated Circuit Technology6 citations
Semantic Scholar
Si GAA NW FETs Threshold Voltage Evaluation
D. Dobrescu, B. Cretu, E. Simoen, A. Veloso +2 more
2022Solid-State Electronics5 citations
Semantic Scholar
Current mirror designed with GAA nanosheet MOSFETs from room temperature to 200 °C
W. Perina, J. Martino, E. Simoen, A. Veloso +1 more
2021Semiconductor Science and Technology5 citations
Semantic Scholar
Analysis of the ZTC-Point for Vertically Stacked Nanosheet pMOS Devices
Carlos H. S. Coelho, J. Martino, E. Simoen, A. Veloso +1 more
20212021 IEEE Latin America Electron Devices Conference (LAEDC)5 citations
Semantic Scholar
(Plenary) The Revival of Compound Semiconductors and How They Will Change the World in a 5G/6G Era
N. Collaert, A. Alian, A. Banerjee, Vikas Chauhan +21 more
2020ECS Meeting Abstracts5 citations
Semantic Scholar
Deep-Level Transient Spectroscopy of GaAs Nanoridge Diodes Grown on Si Substrates
O. Syshchyk, B. Hsu, H.-Y. Yu, V. Motsnyi +13 more
2020Physical Review Applied5 citations
Semantic Scholar
Nanowire & Nanosheet Fets for Advanced Ultra-Scaled, High-Density Logic and Memory Applications
A. Veloso, P. Matagne, G. Eneman, D. Jang +5 more
2020China Semiconductor Technology International Conference5 citations
Semantic Scholar
Understanding Frequency Dependence of Trap Generation Under AC Negative Bias Temperature Instability Stress in Si p-FinFETs
Longda Zhou, Qing-Zhu Zhang, Hong Yang, Z. Ji +12 more
2020IEEE Electron Device Letters5 citations
Semantic Scholar
Evaluation of n-type gate-all-around vertically-stacked nanosheet FETs from 473 K down to 173 K for analog applications
V. Silva, J. A. Martino, E. Simoen, A. Veloso +1 more
2023Solid-State Electronics4 citations Open access
Semantic Scholar
Performance Perspective of Gate-All-Around Double Nanosheet CMOS Beyond High-Speed Logic Applications
E. Simoen, Carlos H. S. Coelho, V. P. da Silva, J. Martino +4 more
2022Journal of Integrated Circuits and Systems4 citations Open access
Semantic Scholar
On the Asymmetry of the DC and Low-Frequency Noise Characteristics of Vertical Nanowire MOSFETs with Bulk Source Contact
E. Simoen, A. Veloso, P. Matagne
2022Solid-State Electronics4 citations
Semantic Scholar
Insights into Scaled Logic Devices Connected from Both Wafer Sides
A. Veloso, G. Eneman, P. Matagne, B. Vermeersch +13 more
2022International Electron Devices Meeting4 citations
Semantic Scholar
High Temperature Influence on the Trade-off between gm/ID and fT of nanosheet NMOS Transistors with Different Metal Gate Stack
V. Silva, J. Martino, E. Simoen, A. Veloso +1 more
2021Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon4 citations
Semantic Scholar
Temperature influence on analog figures-of-merit of nanosheet nMOSFET devices for sub-7nm technology node
V. Silva, W. F. Perina, J. Martino, E. Simoen +2 more
2020Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon4 citations
Semantic Scholar
Degradation Mechanism of Short Channel p- FinFETs under Hot Carrier Stress and Constant Voltage Stress
Hao Chang, Longda Zhou, Hong Yang, Z. Ji +5 more
2020International Symposium on the Physical and Failure Analysis of Integrated Circuits4 citations
Semantic Scholar
Comparative study on NBTI kinetics in Si p-FinFETs with B2H6-based and SiH4-based atomic layer deposition tungsten (ALD W) filling metal
Longda Zhou, Guilei Wang, Xiao-Gen Yin, Z. Ji +13 more
20204 citations
Semantic Scholar
Using the Hexagonal Layout Style for MOSFETs to Boost the Device Matching in Ionizing Radiation Environments
V. Peruzzi, W. S. Cruz, G. A. da Silva, E. Simoen +2 more
20204 citations Open access
Semantic Scholar
(Keynote) Gate-All-Around Nanowire & Nanosheet FETs for Advanced, Ultra-Scaled Technologies
A. Veloso, P. Matagne, D. Jang, Trong Huynh-Bao +6 more
2020ECS Meeting Abstracts4 citations Open access
Semantic Scholar
Novel Y-function based strategy for parameter extraction in S/D asymmetric architecture devices and low frequency noise characterization in GAA Si VNW pMOSFETs
A. Tahiat, B. Cretu, A. Veloso, E. Simoen
2023Solid-State Electronics3 citations Open access
Semantic Scholar
MISHEMT intrinsic voltage gain under multiple channel output characteristics
B. Canales, W. Perina, J. Martino, E. Simoen +3 more
2023Semiconductor Science and Technology3 citations Open access
Semantic Scholar
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets
B. Cretu, A. Veloso, E. Simoen
2023Solid-State Electronics3 citations Open access
Semantic Scholar
Impact of gate current on the operational transconductance amplifier designed with nanowire TFETs
Alexandro de M. Nogueira, Paula Ghedini Der Agopian, E. Simoen, R. Rooyackers +3 more
20213 citations
Semantic Scholar
Analysis of semi-insulating carbon-doped GaN layers using deep-level transient spectroscopy
Hongyue Wang, Po-Chun Hsu, Ming Zhao, E. Simoen +3 more
2021Journal of Applied Physics3 citations Open access
Semantic Scholar
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs
Longda Zhou, Zhao-Hao Zhang, Hong Yang, Z. Ji +8 more
2021IEEE International Reliability Physics Symposium3 citations
Semantic Scholar
Temperature-Dependent Electrical Properties of nMOSFETs With Different Thickness Al₂O₃ Capping Layer and TiN Gate
Danghui Wang, Jun-Fei Zheng, Yang Zhang, Tian-Han Xu +3 more
2021IEEE Transactions on Electron Devices3 citations
Semantic Scholar
Recovery Behavior of Interface Traps After Negative Bias Temperature Instability Stress in p-FinFETs Featuring Fast Trap Characterization Technique
Longda Zhou, Qing-Zhu Zhang, Hong Yang, Zhi-Gang Ji +10 more
2021IEEE Transactions on Electron Devices3 citations
Semantic Scholar

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