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S. Fujieda · SciRah

Researcher profile · Semantic Scholar

S. Fujieda

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S. Fujieda — researcher profile on SciRah

h-index: 15
Works: 96
Citations: 957

Most-cited papers

Low Temperature Growth of GaN and AlN on GaAs Utilizing Metalorganics and Hydrazine
M. Mizuta, S. Fujieda, Y. Matsumoto, T. Kawamura
1986187 citations Open access
Semantic Scholar
Interface defects responsible for negative-bias temperature instability in plasma-nitrided SiON/Si(100) systems
S. Fujieda, Y. Miura, M. Saitoh, E. Hasegawa +2 more
200365 citations
Semantic Scholar
Structure Control of GaN Films Grown on (001) GaAs Substrates by GaAs Surface Pretreatments
S. Fujieda, Y. Matsumoto
199143 citations Open access
Semantic Scholar
Structural defects working as active oxygen-reduction sites in partially oxidized Ta-carbonitride core-shell particles probed by using surface-sensitive conversion-electron-yield x-ray absorption spectroscopy
H. Imai, M. Matsumoto, T. Miyazaki, S. Fujieda +3 more
201040 citations
Semantic Scholar
Growth Characterization of Low-Temperature MOCVD GaN–Comparison between N2H4 and NH3–
S. Fujieda, M. Mizuta, Y. Matsumoto
198736 citations Open access
Semantic Scholar
Influence of H2-annealing on the hydrogen distribution near SiO2/Si(100) interfaces revealed by in situ nuclear reaction analysis
M. Wilde, M. Matsumoto, K. Fukutani, Zi-Yuan Liu +3 more
200235 citations
Semantic Scholar
Single silicon vacancy-oxygen complex defect and variable retention time phenomenon in dynamic random access memories
T. Umeda, K. Okonogi, Kiyonori Ohyu, S. Tsukada +3 more
200633 citations Open access
Semantic Scholar
Single‐crystal Al growth on Si(111) by low‐temperature molecular beam epitaxy
Y. Miura, S. Fujieda, K. Hirose
199332 citations
Semantic Scholar
Improvement of the Electrical Properties of the AlN/GaAs MIS System and Their Thermal Stability by GaAs Surface Stoichiometry Control
S. Fujieda, M. Mizuta, Y. Matsumoto
198831 citations
Semantic Scholar
Quantitative identification for the physical origin of variable retention time: A vacancy-oxygen complex defect model
Kiyonori Ohyu, T. Umeda, Kensuke Okonogi, S. Tsukada +3 more
2006International Electron Devices Meeting19 citations
Semantic Scholar
Interfacial Superstructure of AlN/n-GaAs(001) System Fabricated by Metalorganic Chemical Vapor Deposition
K. Akimoto, I. Hirosawa, J. Mizuki, S. Fujieda +2 more
198818 citations Open access
Semantic Scholar
Mechanism of Gas Generation in Lithium Ion Batteries by Overdischarge
Mana Hashimoto, M. Yamashiro, T. Ichihashi, A. Toda +2 more
201516 citations Open access
Semantic Scholar
Structural characterization of amorphous Ta2O5 and SiO2–Ta2O5 used as solid electrolyte for nonvolatile switches
N. Banno, T. Sakamoto, N. Iguchi, M. Matsumoto +8 more
201016 citations
Semantic Scholar
Effect of Nitrogen Profile and Fluorine Incorporation on Negative-Bias Temperature Instability of Ultrathin Plasma-Nitrided SiON MOSFETs
M. Terai, Koji Watanabe, S. Fujieda
2007IEEE Transactions on Electron Devices16 citations
Semantic Scholar
Current Understanding of the Transport Behavior of Hydrogen Species in MOS Stacks and Their Relation to Reliability Degradation
Zi-Yuan Liu, S. Fujieda, Hirokazu Ishigaki, M. Wilde +1 more
201115 citations Open access
Semantic Scholar
Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si<1 0 0> systems
S. Fujieda, Y. Miura, M. Saitoh, Y. Teraoka +1 more
2005Microelectronics and reliability15 citations
Semantic Scholar
On-state reliability of solid-electrolyte switch
N. Banno, T. Sakamoto, S. Fujieda, M. Aono
2008IEEE International Reliability Physics Symposium14 citations
Semantic Scholar
1.2 nm HfSiON/SiON Stacked Gate Insulators for 65-nm-Node MISFETs
M. Saitoh, M. Terai, N. Ikarashi, Heiji Watanabe +7 more
200514 citations Open access
Semantic Scholar
Impact of mechanical stress on interface trap generation in Flash EEPROMs
A. Toda, S. Fujieda, Koji Kanamori, J. Suzuki +4 more
20052005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.13 citations
Semantic Scholar
Spin-Dependent Trap-Assisted Tunneling Current in Ultra-Thin Gate Dielectrics
Y. Miura, S. Fujieda
200013 citations Open access
Semantic Scholar
Low‐temperature metalorganic chemical vapour deposition of AlN for surface passivation of GaAs
S. Fujieda, M. Mizuta, Y. Matsumoto
199613 citations
Semantic Scholar
Direct observation of extended monolayer flat islands at metalorganic vapor phase epitaxy grown Al0.5Ga0.5As‐GaAs single quantum well interfaces
F. J. Stützler, S. Fujieda, M. Mizuta, K. Ishida
198813 citations
Semantic Scholar
Effect of ReRAM-stack asymmetry on read disturb immunity
M. Terai, S. Kotsuji, H. Hada, N. Iguchi +2 more
2009IEEE International Reliability Physics Symposium12 citations
Semantic Scholar
Influence of Charge Traps within HfSiON Bulk on Positive and Negative Bias Temperature Instability of HfSiON Gate Stacks
S. Fujieda, S. Kotsuji, A. Morioka, M. Terai +1 more
200511 citations Open access
Semantic Scholar
Nitridation effects on Pb center structures at SiO2/Si(100) interfaces
Y. Miura, S. Fujieda
200411 citations Open access
Semantic Scholar
Hydrogen redistribution induced by negative-bias-temperature stress in metal–oxide–silicon diodes
Zi-Yuan Liu, S. Fujieda, K. Terashima, M. Wilde +1 more
200211 citations
Semantic Scholar
Structural investigation of thermally nitrided amorphous Ti silicide
Y. Miura, S. Fujieda
199711 citations
Semantic Scholar
Different Fermi-level pinning positions between epitaxial and rotational Al/Si interfaces.
Y. Miura, S. Fujieda, K. Hirose
1994Physical Review B (Condensed Matter)11 citations
Semantic Scholar
A Ta2O5 Solid-electrolyte Switch with Improved Reliability
Banno Naoki, T. Sakamoto, N. Iguchi, S. Fujieda +3 more
200810 citations
Semantic Scholar
Control of GaAs Schottky barrier height by formation of a thin off‐stoichiometric GaAs interlayer grown by low‐temperature molecular beam epitaxy
S. Fujieda
199210 citations
Semantic Scholar
Control of the Electrical Properties of AlN/thin-a-Si/GaAs MIS Diodes by GaAs Surface Pretreatments
S. Fujieda, Y. Mochizuki, K. Akimoto, I. Hirosawa +2 more
199010 citations Open access
Semantic Scholar
Charge trapping characteristics of the interface states in an AlN/GaAs metal‐insulator‐semiconductor structure
Y. Mochizuki, M. Mizuta, S. Fujieda, Y. Matsumoto
198910 citations
Semantic Scholar
Influence of Hydrogen Permeability of Liner Nitride Film on Program/Erase Endurance of Split-Gate Type Flash EEPROMS
Zi-Yuan Liu, S. Fujieda, F. Hayashi, Masakuni Shimizu +4 more
20072007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual9 citations
Semantic Scholar
Non-volatile FCG (ferroelectric-capacitor and transistor-gate connection) memory cell with non-destructive read-out operation
Y. Katoh, S. Fujieda, Y. Hayashi, T. Kunio
19961996 Symposium on VLSI Technology. Digest of Technical Papers9 citations
Semantic Scholar
Lateral Profile of Trapped Charges in Split-Gate SONOS Memory
Y. Tsuji, Masayuki Terai, S. Fujieda, Toshiyuki Syo +2 more
2010IEEE Transactions on Electron Devices8 citations
Semantic Scholar
A 65nm-node LSTP (Low standby power) poly-Si/a-Si/HfSiON transistor with high I/sub on/-I/sub standby/ ratio and reliability
Y. Yasuda, N. Kimizuka, T. Iwamoto, S. Fujieda +7 more
2004Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004.8 citations
Semantic Scholar
Breakdown Mechanisms and Lifetime Prediction for 90-nm-Node Low-Power HfSiON/SiO2 CMOSFETs
M. Terai, Y. Yabe, S. Fujieda, A. Morioka +6 more
20048 citations
Semantic Scholar
Control of GaAs Schottky barrier height using a thin nonstoichiometric GaAs interface layer grown by low‐temperature molecular beam epitaxy
S. Fujieda
19938 citations
Semantic Scholar
GeAs as a novel arsenic dimer source for n‐type doping of Ge grown by molecular beam epitaxy
M. Kawanaka, N. Iguchi, S. Fujieda, A. Furukawa +1 more
19937 citations
Semantic Scholar
Influence of conformation on the absorption spectra of flexible organic dyes used in dye-sensitized solar cells
H. Fukunishi, S. Nakamura, S. Fujieda
20136 citations
Semantic Scholar
Cu-ion diffusivity in SiO2-Ta2O5 solid electrolyte and its impact on the yield of resistance switching after BEOL processes
N. Banno, T. Sakamoto, H. Hada, N. Kasai +6 more
2009IEEE International Reliability Physics Symposium6 citations
Semantic Scholar
Improvement of Data Retention Time Property by Reducing Vacancy-Type Defect in DRAM Cell Transistor
Kensuke Okonogi, Kiyonori Ohyu, T. Umeda, Hideharu Miyake +1 more
20062006 IEEE International Reliability Physics Symposium Proceedings6 citations
Semantic Scholar
Properties of a SiNx/Si/GaAs system having amorphous and crystalline Si interlayers on (100) GaAs with different surface superstructures
S. Fujieda, E. Benoit, T. Baba
19926 citations
Semantic Scholar
A novel method for evaluating electron/hole mismatch in scaled split-gate SONOS memories
Y. Tsuji, Masayuki Terai, S. Fujieda, Toshiyuki Syo +2 more
20082008 IEEE International Electron Devices Meeting5 citations
Semantic Scholar
Paramagnetic Defects Related to Positive Charges in Silicon Oxynitride Films
Y. Miura, S. Fujieda, E. Hasegawa
20005 citations Open access
Semantic Scholar
Surface Reaction Analysis of Tantalum-Oxide Oxygen-Reduction Catalysts by Using X-ray Photoelectron Spectroscopy
M. Matsumoto, T. Miyazaki, S. Fujieda, A. Ishihara +2 more
20134 citations Open access
Semantic Scholar
Charge centers induced in thermal SiO2 films by high electric field stress at 80 K
S. Fujieda
20014 citations Open access
Semantic Scholar
Thermal Stability of the AlN/a-Si/GaAs MIS Diodes with Different GaAs Surface Stoichiometry
S. Fujieda
19904 citations
Semantic Scholar
Effects of InP Surface Treatment on the Electrical Properties and Structures of AlN/n-InP Interface
S. Fujieda, K. Akimoto, I. Hirosawa, J. Mizuki +2 more
19894 citations Open access
Semantic Scholar
Structural Characterization of ORR Active Surface Niobium Oxides on Partially Oxidized Nb Carbonitrides
M. Matsumoto, T. Miyazaki, S. Fujieda, Y. Ohgi +3 more
20113 citations Open access
Semantic Scholar

Frequent co-authors

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M. Mizuta×6
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Zi-Yuan Liu — researcher profile on SciRah