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J. Stover · SciRah

Researcher profile · Semantic Scholar

J. Stover

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J. Stover — researcher profile on SciRah

h-index: 16
Works: 162
Citations: 1,896

Most-cited papers

Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment.
J. M. Elson, Jean M. Bennett, J. Stover
1993Applied Optics41 citations
Semantic Scholar
Unified scatter model for rough surfaces at large incident and scatter angles
J. Harvey, A. Krywonos, J. Stover
2007SPIE Optical Engineering + Applications40 citations
Semantic Scholar
Optical Scattering: Measurements and Analysis, Third Edition
J. Stover
201239 citations
Semantic Scholar
Power spectral densities: A multiple technique study of different Si wafer surfaces
E. Marx, I. J. Malik, T. Bristow, N. Poduje +3 more
200236 citations
Semantic Scholar
Design review of a high-accuracy UV to near-IR scatterometer
T. Schiff, Mary W. Knighton, Daniel J. Wilson, F. Cady +2 more
1993Optics & Photonics33 citations
Semantic Scholar
Light scattering, straylight, and optical quality in hydrophobic acrylic intraocular lenses with subsurface nanoglistenings
L. Werner, J. Stover, J. Schwiegerling, K. Das
2016Journal of cataract and refractive surgery30 citations
Semantic Scholar
Modeling scatter from silicon wafer features based on discrete sources method
Y. Eremin, J. Stover, N. V. Orlov
199928 citations
Semantic Scholar
Effects of Intraocular Lens Opacification on Light Scatter, Stray Light, and Overall Optical Quality/Performance.
L. Werner, J. Stover, J. Schwiegerling, K. Das
2016Investigative Ophthalmology and Visual Science27 citations Open access
Semantic Scholar
Binary pseudo-random gratings and arrays for calibration of modulation transfer functions of surface profilometers
S. Barber, Erik D. Anderson, R. Cambie, W. McKinney +4 more
201027 citations Open access
Semantic Scholar
Measurement of Silicon Particles by Laser Surface Scanning and Angle‐Resolved Light Scattering
H. Huff, R. Goodall, Elton Williams, Keung-Shan Woo +7 more
199727 citations Open access
Semantic Scholar
Technique for measuring forward light scatter in intraocular lenses
K. Das, J. Stover, J. Schwiegerling, M. Karakelle
2013Journal of cataract and refractive surgery23 citations
Semantic Scholar
Limitations of Rayleigh Rice Perturbation Theory for describing surface scatter
J. Stover, J. Harvey
2007SPIE Optical Engineering + Applications13 citations
Semantic Scholar
Results of edge scatter testing for a starshade mission
S. Casement, S. Warwick, Daniel Smith, S. Ellis +1 more
2016Astronomical Telescopes + Instrumentation12 citations
Semantic Scholar
Angle-Resolved Diffuse Reflectance and Transmittance
T. Germer, J. Stover, Sven Schröder
201412 citations
Semantic Scholar
Development of a smooth-surface microroughness standard
Bradley W. Scheer, J. Stover
1997Optics & Photonics12 citations
Semantic Scholar
Use of the surface PSD and incident angle adjustments to investigate near specular scatter from smooth surfaces
K. Tayabaly, J. Stover, Robert E. Parks, M. Dubin +1 more
2013Optics & Photonics - Optical Engineering + Applications10 citations
Semantic Scholar
Light scatter metrology of diamond turned optics
J. Stover
2005SPIE Optics + Photonics10 citations
Semantic Scholar
Comparison of surface PSDs calculated from both AFM profiles and scatter data
J. Stover, V. Ivakhnenko, Craig A. Scheer
1998Photonics West9 citations
Semantic Scholar
Design review of a unique out-of-plane polarimetric scatterometer
T. Schiff, J. Stover, Daniel J. Wilson, B. D. Swimley +2 more
1993Optics & Photonics9 citations
Semantic Scholar
Angle and wavelength resolved light scattering measurement of optical surfaces and thin films
S. Schröder, David Unglaub, Alexander von Finck, M. Hauptvogel +4 more
2013Optics & Photonics - Optical Engineering + Applications8 citations
Semantic Scholar
Estimating hemispherical scatter from incident plane measurements of isotropic samples
J. Stover, Sven Schröder, Alexander von Finck, A. Duparré
2012Other Conferences8 citations
Semantic Scholar
Optical scattering in the optics, semiconductor, and computer disk industries : proceedings, 13-14 July 1995, San Diego, California
J. Stover
19958 citations
Semantic Scholar
Measurement and analysis of scatter from rough surfaces
J. Stover, M. Bernt, E. Church
1994Optics & Photonics8 citations
Semantic Scholar
Upper roughness limitations on the TIS/RMS relationship
J. Stover, Sven Schröder, T. Germer
2012Other Conferences7 citations
Semantic Scholar
Experimental confirmation of the Rayleigh-Rice obliquity factor
J. Stover
2010Optical Engineering + Applications7 citations
Semantic Scholar
Accurate sizing of deposited PSL spheres from light scatter measurements
J. Stover, Craig A. Scheer
2001SPIE Optics + Photonics7 citations
Semantic Scholar
Discrete sources method for light scattering analysis from 3D asymmetrical features on a substrate
Y. Eremin, J. Stover, N. Grishina
20016 citations
Semantic Scholar
Round robin determination of power spectral densities of different Si wafer surfaces
E. Marx, I. J. Malik, Y. Strausser, T. Bristow +2 more
1998Photonics West6 citations
Semantic Scholar
Measurement and analysis of scatter from silicon wafers
J. Stover, M. Bernt, E. Church, P. Takacs
1994Optics & Photonics6 citations
Semantic Scholar
Mueller matrix measurements of scattered light
T. Schiff, J. Stover, Brett D. Swimley, D. R. Bjork
1993Optics & Photonics6 citations
Semantic Scholar
Wavelength scaling investigation of several materials
J. Stover, M. Bernt, Charles Egert
1993Optics & Photonics6 citations
Semantic Scholar
Estimating hemispherical scatter from incident plane measurements of isotropic samples scattering from both bulk and surface irregularities
J. Stover, Sven L. M. Schroeder, Alexander von Finck, David Unglaub +1 more
2013Optics & Photonics - Optical Engineering + Applications5 citations
Semantic Scholar
Scatter metrology of photovoltaic textured surfaces
J. Stover, Eric Loren Hegstrom
2010Optics + Photonics for Sustainable Energy5 citations
Semantic Scholar
International round-robin experiment for angle-resolved light scattering measurement.
A. von Finck, T. Herffurth, A. Duparré, S. Schröder +19 more
2019Applied Optics4 citations Open access
Semantic Scholar
A cross-polarized freeform illumination design for glare reduction in fruit quality inspection
Janos C. Keresztes, R. J. Koshel, R. Chipman, J. Stover +1 more
2015SPIE Optical Systems Design4 citations
Semantic Scholar
Rough surface characterization and comparison of scatter measurements and models
J. Stover
2005SPIE Optics + Photonics4 citations
Semantic Scholar
Use of light scatter signals to identify particle material
J. Stover, V. Ivakhnenko, Y. Eremin
2001SPIE Optics + Photonics4 citations
Semantic Scholar
Comparison of models and measurements of scatter from surface-bound particles
Craig A. Scheer, J. Stover, V. Ivakhnenko
1998Photonics West4 citations
Semantic Scholar
Introduction to Light Scatter
J. Stover
19954 citations
Semantic Scholar
Evaluation of sapphire at II-VI Optical Systems for HEL applications
Melissa Seitz, Nathan Stoddard, Bruce Glick, J. Stover
2019Defense + Commercial Sensing3 citations
Semantic Scholar
The art of specifying surface quality
J. Stover, Sen Han
2014Photonics Asia3 citations
Semantic Scholar
Multiple particle technique for determination of differential scattering cross section of very small surface bound particles
J. Stover, M. Bernt
1995Optics & Photonics3 citations
Semantic Scholar
TIS uniformity maps of wafers, disks, and other samples
J. Stover, M. Bernt, T. Schiff
1995Optics & Photonics3 citations
Semantic Scholar
Linking Rayleigh-Rice theory with near linear shift invariance in light scattering phenomena
J. Stover, Sven L. M. Schroeder, C. Staats, V. Lopushenko +1 more
2016Optical Engineering + Applications2 citations
Semantic Scholar
Effects of intraocular lens opacification versus subsurface nanoglistenings on light scatter and overall optical quality/performance
L. Werner, J. Stover, J. Schwiegerling, K. Das
20152 citations
Semantic Scholar
Quantifying Surface Roughness
J. Stover
20122 citations
Semantic Scholar
Modeling, Measurement, and Standards for Wafer Inspection, Government Microcircuits Applications and Critical Technologies
G. Mulholland, T. Germer, J. Stover
20032 citations
Semantic Scholar
Power spectral density functions for Si wafer surfaces using six measurement techniques
E. Marx, I. J. Malik, T. Bristow, N. Poduje +1 more
20012 citations Open access
Semantic Scholar
Measurement of scatter from PSL standard spheres deposited on disk surfaces
Craig A. Scheer, J. Stover
1999Photonics West2 citations
Semantic Scholar
Modeling of scatter from small pits of arbitrary shape
V. Ivakhnenko, Craig A. Scheer, J. Stover
1998Photonics West2 citations
Semantic Scholar

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