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T. Germer · SciRah

Researcher profile · Semantic Scholar

T. Germer

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T. Germer — researcher profile on SciRah

h-index: 35
Works: 197
Citations: 3,578

Most-cited papers

Detection of circular polarization in light scattered from photosynthetic microbes
W. Sparks, J. Hough, T. Germer, Feng Chen +8 more
2009Proceedings of the National Academy of Sciences of the United States of America138 citations Open access
Semantic Scholar
Modelling photovoltaic soiling losses through optical characterization
G. Smestad, T. Germer, Hameed Alrashidi, E. Fernández +14 more
2020Scientific Reports129 citations Open access
Semantic Scholar
Circular polarization in scattered light as a possible biomarker
W. Sparks, J. Hough, L. Kolokolova, T. Germer +8 more
200988 citations Open access
Semantic Scholar
Gaps analysis for CD metrology beyond the 22nm node
B. Bunday, T. Germer, V. Vartanian, A. Cordes +2 more
2013Advanced Lithography83 citations
Semantic Scholar
Fundamental limits of optical critical dimension metrology: a simulation study
R. Silver, T. Germer, R. Attota, B. Barnes +4 more
2007SPIE Advanced Lithography82 citations
Semantic Scholar
Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis.
R. Attota, T. Germer, R. Silver
2008Optics Letters79 citations
Semantic Scholar
Developing an uncertainty analysis for optical scatterometry
T. Germer, H. Patrick, R. Silver, B. Bunday
2009Advanced Lithography72 citations
Semantic Scholar
Polarized optical scattering signatures from biological materials
W. Martin, E. Hesse, J. Hough, W. Sparks +4 more
201059 citations Open access
Semantic Scholar
Relaxation behavior of polymer structures fabricated by nanoimprint lithography.
Yi-Fu Ding, H. Ro, T. Germer, J. Douglas +3 more
2007ACS Nano57 citations
Semantic Scholar
Spectrophotometry : accurate measurement of optical properties of materials
T. Germer, J. Zwinkels, Benjamin K. Tsai
201455 citations
Semantic Scholar
Compact and robust method for full Stokes spectropolarimetry.
W. Sparks, T. Germer, J. Mackenty, F. Snik
2012Applied Optics50 citations Open access
Semantic Scholar
Imaging linear and circular polarization features in leaves with complete Mueller matrix polarimetry
C. H. Lucas Patty, David A. Luo, F. Snik, F. Ariese +7 more
2018Biochimica et Biophysica Acta - General Subjects48 citations Open access
Semantic Scholar
Effective medium approximations for modeling optical reflectance from gratings with rough edges.
B. Bergner, T. Germer, T. Suleski
2010Journal of The Optical Society of America A-optics Image Science and Vision36 citations
Semantic Scholar
Improving optical measurement accuracy using multi-technique nested uncertainties
R. Silver, N.-F. Zhang, B. Barnes, Hui Zhou +4 more
2009Advanced Lithography34 citations
Semantic Scholar
Effect of line and trench profile variation on specular and diffuse reflectance from a periodic structure.
T. Germer
2007Journal of The Optical Society of America A-optics Image Science and Vision33 citations
Semantic Scholar
Optical critical dimension measurement of silicon grating targets using back focal plane scatterfield microscopy
H. Patrick, R. Attota, B. Barnes, T. Germer +4 more
200832 citations
Semantic Scholar
Out-of-plane Stokes imaging polarimeter for early skin cancer diagnosis
P. Ghassemi, P. Lemaillet, T. Germer, J. Shupp +5 more
2012Journal of Biomedical Optics30 citations Open access
Semantic Scholar
Scatterometry for in situ measurement of pattern reflow in nanoimprinted polymers
H. Patrick, T. Germer, Yi-Fu Ding, H. Ro +2 more
200827 citations
Semantic Scholar
Remote Sensing of Chiral Signatures on Mars
W. Sparks, J. Hough, T. Germer, F. Robb +1 more
201224 citations Open access
Semantic Scholar
Realizable differential matrices for depolarizing media.
T. Germer
2012Optics Letters23 citations
Semantic Scholar
BRDF measurements of graphite used in high-temperature fixed point blackbody radiators: a multi-angle study at 405 nm and 658 nm
H. Patrick, L. Hanssen, Ji-Nan Zeng, T. Germer
201222 citations
Semantic Scholar
The NIST Robotic Optical Scatter Instrument (ROSI) and its application to BRDF measurements of diffuse reflectance standards for remote sensing
H. Patrick, C. Zarobila, T. Germer
2013Optics & Photonics - Optical Engineering + Applications21 citations
Semantic Scholar
Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene
T. Germer
2017Applied Optics18 citations Open access
Semantic Scholar
Progress toward traceable nanoscale optical critical dimension metrology for semiconductors
H. Patrick, T. Germer
2007SPIE Optical Engineering + Applications18 citations
Semantic Scholar
PyMatting: A Python Library for Alpha Matting
T. Germer, Tobias Uelwer, Stefan Conrad, Stefan Harmeling
2020Journal of Open Source Software17 citations Open access
Semantic Scholar
Effect of bandwidth and numerical aperture in optical scatterometry
T. Germer, H. Patrick
2010Advanced Lithography17 citations
Semantic Scholar
pySCATMECH: a Python interface to the SCATMECH library of scattering codes
T. Germer
2020Optical Engineering + Applications16 citations
Semantic Scholar
Classical polarimetry with a twist
W. Sparks, T. Germer, Rebecca M. Sparks
2019Publications of the Astronomical Society of the Pacific. Astronomical Society of the Pacific15 citations Open access
Semantic Scholar
Uncertainty in global downwelling plane irradiance estimates from sintered polytetrafluoroethylene plaque radiance measurements
A. Castagna, B. Johnson, K. Voss, H. Dierssen +4 more
2019Applied Optics15 citations Open access
Semantic Scholar
Intercomparison between optical and x-ray scatterometry measurements of FinFET structures
P. Lemaillet, T. Germer, R. J. Kline, Daniel F. Sunday +2 more
2013Advanced Lithography15 citations
Semantic Scholar
Modeling the effect of line profile variation on optical critical dimension metrology
T. Germer
2007SPIE Advanced Lithography15 citations
Semantic Scholar
Spectropolarimetry of Primitive Phototrophs as Global Surface Biosignatures
W. Sparks, M. N. Parenteau, Robert Eugene Blankenship, T. Germer +4 more
2020Astrobiology14 citations Open access
Semantic Scholar
In situ measurement of annealing-induced line shape evolution in nanoimprinted polymers using scatterometry
H. Patrick, T. Germer, Yi-Fu Ding, H. Ro +2 more
2009Advanced Lithography13 citations
Semantic Scholar
Angle-Resolved Diffuse Reflectance and Transmittance
T. Germer, J. Stover, Sven Schröder
201412 citations
Semantic Scholar
Generalized ellipsometry of artificially designed line width roughness
M. Foldyna, T. Germer, B. Bergner, R. Dixson
201112 citations
Semantic Scholar
Effect of line-width roughness on optical scatterometry measurements
B. Bergner, T. Germer, T. Suleski
2009Advanced Lithography12 citations
Semantic Scholar
Tunable supercontinuum fiber laser source for BRDF measurements in the STARR II gonioreflectometer
H. Patrick, C. Zarobila, T. Germer, Victor A. Ying +2 more
2012Other Conferences11 citations
Semantic Scholar
Structured illumination Mueller matrix imaging.
Joseph P. Angelo, T. Germer, M. Litorja
2019Biomedical Optics Express10 citations Open access
Semantic Scholar
Theoretical Concepts in Spectrophotometric Measurements
T. Germer, J. Zwinkels, Benjamin K. Tsai
201410 citations
Semantic Scholar
Anisotropic, hierarchical surface patterns via surface wrinkling of nanopatterned polymer films.
Jung-Hyun Lee, H. Ro, Rui Huang, Paul Lemaillet +3 more
2012Nano letters (Print)10 citations
Semantic Scholar
Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards
T. Germer, H. Patrick
2011Optical Engineering + Applications10 citations
Semantic Scholar
Calibration of wafer surface inspection systems using spherical silica nanoparticles.
T. Germer, C. Wolters, D. Brayton
2008Optics Express10 citations Open access
Semantic Scholar
Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering Instrument
H. Patrick, Catherine C. Cooksey, T. Germer, M. Nadal +1 more
2021Applied Optics9 citations Open access
Semantic Scholar
Fast Multi-Level Foreground Estimation
T. Germer, Tobias Uelwer, Stefan Conrad, Stefan Harmeling
2020International Conference on Pattern Recognition9 citations Open access
Semantic Scholar
Plasma nanotexturing of silicon surfaces for photovoltaics applications: influence of initial surface finish on the evolution of topographical and optical properties
G. Fischer, E. Drahi, M. Foldyna, T. Germer +1 more
2017Optics Express9 citations Open access
Semantic Scholar
Nanoscale Measurements with a Through-Focus Scanning-Optical-Microscope | NIST
R. Attota, R. Silver, T. Germer
20098 citations
Semantic Scholar
Modeling the effect of finite size gratings on scatterometry measurements
E. Kenyon, M. Cresswell, H. Patrick, T. Germer
2008SPIE Advanced Lithography8 citations
Semantic Scholar
Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film
T. Germer, K. Sharma, T. Brown, J. B. Oliver
2017Journal of The Optical Society of America A-optics Image Science and Vision7 citations Open access
Semantic Scholar
Upper roughness limitations on the TIS/RMS relationship
J. Stover, Sven Schröder, T. Germer
2012Other Conferences7 citations
Semantic Scholar
Characterization of surface texture-measuring optical microscopes using a binary pseudo-random array standard
U. Griesmann, K. Munechika, Thomas Brian Renegar, X. Zheng +7 more
2022Optical Engineering + Applications6 citations Open access
Semantic Scholar

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