Researcher profile · Semantic Scholar

Takuma Suzuki

h-index: 11
Works: 44
Citations: 573

Most-cited papers

Noise of Acoustic Doppler Velocimeter Data in Bubbly Flows
N. Mori, Takuma Suzuki, Shohachi Kakuno
2007288 citations
Semantic Scholar
Experimental study of air bubbles and turbulence characteristics in the surf zone
N. Mori, Takuma Suzuki, Shohachi Kakuno
200762 citations Open access
Semantic Scholar
Significant Improvement in Reliability of Thermal Oxide on 4H-SiC (0001) Face Using Ammonia Post-Oxidation Annealing
J. Senzaki, Takuma Suzuki, Atsushi Shimozato, K. Fukuda +2 more
201026 citations Open access
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Reliability of 4H-SiC(000-1) MOS Gate Oxide Using N2O Nitridation
Takuma Suzuki, J. Senzaki, T. Hatakeyama, K. Fukuda +2 more
200923 citations Open access
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Relation between interdiffusion and polarity for MBE growth of GaN epilayers on ZnO substrates
Takuma Suzuki, C. Harada, H. Goto, T. Minegishi +4 more
200422 citations
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Polarity control of GaN epilayers grown on ZnO templates
Takuma Suzuki, H. Ko, A. Setiawan, Jungjin Kim +3 more
200318 citations
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Impact of Oxidation Conditions and Surface Defects on the Reliability of Large-Area Gate Oxide on the C-Face of 4H-SiC
T. Hatakeyama, Takuma Suzuki, K. Ichinoseki, H. Matsuhata +3 more
201016 citations
Semantic Scholar
Influence of Processing and of Material Defects on the Electrical Characteristics of SiC-SBDs and SiC-MOSFETs
K. Fukuda, A. Kinoshita, T. Ohyanagi, R. Kosugi +16 more
201016 citations Open access
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14.6 mΩcm2 3.3 kV DIMOSFET on 4H-SiC (000-1)
H. Kono, Masaru Furukawa, K. Ariyoshi, Takuma Suzuki +2 more
201415 citations
Semantic Scholar
Effect of Gate Wet Reoxidation on Reliability and Channel Mobility of Metal-Oxide-Semiconductor Field-Effect Transistors Fabricated on 4H-SiC(000-1)
Takuma Suzuki, J. Senzaki, T. Hatakeyama, K. Fukuda +2 more
200812 citations Open access
Semantic Scholar
Analysis of Dislocation Structures in 4H‐SiC by Synchrotron X‐Ray Topography
H. Matsuhata, H. Yamaguchi, T. Sekiguchi, Bin Chen +7 more
201611 citations
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Impact of the Wafer Quality on the Reliability of MOS Structure on the C-Face of 4H-SiC
T. Hatakeyama, Takuma Suzuki, J. Senzaki, K. Fukuda +3 more
20089 citations Open access
Semantic Scholar
Reduction of dislocation density and improvement of optical quality in ZnO layers by MgO-buffer annealing ☆
H. Goto, H. Makino, A. Setiawan, Takuma Suzuki +4 more
20048 citations
Semantic Scholar
High-speed and low switching loss operation of 1700 V 60 A SiC MOSFETs installed in low parasitic inductance module
H. Kono, K. Takao, Takuma Suzuki, T. Shinohe
2014International Symposium on Power Semiconductor Devices and IC's6 citations
Semantic Scholar
Effects of Surface Morphological Defects and Crystallographic Defects on Reliability of Thermal Oxides on C-Face
Takuma Suzuki, H. Yamaguchi, T. Hatakeyama, H. Matsuhata +4 more
20126 citations Open access
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Stress dependence on N/Ga ratio in GaN epitaxial films grown on ZnO substrates
T. Minegishi, Takuma Suzuki, C. Harada, H. Goto +2 more
20046 citations
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Breakthrough in Channel Mobility Limit of Nitrided Gate Insulator for SiC DMOSFET with Novel High-temperature N2 Annealing
S. Asaba, Toshihide Ito, S. Fukatsu, Y. Nakabayashi +4 more
2019International Symposium on Power Semiconductor Devices and IC's5 citations
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A surface sensitive optical method for the evaluation of processed ZnO: exploitation of LO phonon interaction
C. Harada, H. Goto, T. Minegishi, Takuma Suzuki +3 more
20045 citations
Semantic Scholar
1360 V, 5.0 mΩcm2 Double-Implanted MOSFETs Fabricated on 4H-SiC(000-1)
H. Kono, Takuma Suzuki, M. Mizukami, C. Ota +4 more
20103 citations
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Formation of Extended Defects in 4H-SiC Induced by Ion Implantation/Annealing
M. Nagano, H. Tsuchida, Takuma Suzuki, T. Hatakeyama +2 more
20093 citations Open access
Semantic Scholar
Spatio temporal Variation of the Density Distributions in Ar RF Plasmas Using the Monte Carlo Simulation/Legendre Polynomial Weighted Sampling Method
Ikuya Horie, Takuma Suzuki, K. Kitamori, K. Maruyama
20033 citations Open access
Semantic Scholar
Detection and Characterization of Defects Induced by Ion Implantation/Annealing Process in SiC
M. Nagano, H. Tsuchida, Takuma Suzuki, T. Hatakeyama +2 more
20082 citations Open access
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POTENTIAL DROP IMAGING TECHNIQUE FOR SENSITIVE NDE OF SMALL SURFACE CRACKS
M. Saka, H. Tohmyoh, Takuma Suzuki, S. Ahmed
20062 citations
Semantic Scholar
1.4kV Double-Implanted MOSFETs Fabricated on 4H-SiC(000-1)
H. Kono, Takuma Suzuki, K. Takao, Masaru Furukawa +6 more
20111 citations Open access
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Condition Dependences of Extended Defect Formation in 4H-SiC by Ion-Implantation/Activation-Anneal Process
M. Nagano, H. Tsuchida, Takuma Suzuki, T. Hatakeyama +2 more
20101 citations Open access
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Reliability of Large-Area Gate Oxide on the C-Face of 4H-SiC
T. Hatakeyama, H. Kono, Takuma Suzuki, J. Senzaki +3 more
20091 citations
Semantic Scholar
Measurement of Potential Drop Distribution by Scanning the Closely Coupled Probes Sensor for Sensitive NDE of Shallow Surface Cracks
H. Tohmyoh, Takuma Suzuki, S. Ahmed, M. Saka
20071 citations Open access
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Electron Transport in Nonorthogonal Crossed DC Electric and Magnetic Fields
Ikuya Horie, Takuma Suzuki, K. Kitamori, K. Maruyama
20031 citations Open access
Semantic Scholar
TED-AJ03-187 TURBULENT HEAT TRANSFER IN A SYMMETRIC EXPANSION PLANE CHANNEL
T. Ota, Y. Okagawa, Takuma Suzuki, S. K. Park
20021 citations Open access
Semantic Scholar
Influence of JFET Region Design on the Repetitive Short-Circuit Ruggedness in Trench SiC MOSFETs
Katsuhisa Tanaka, Yuji Kusumoto, M. Yukumoto, T. Kiyosawa +3 more
2026International Symposium on Power Semiconductor Devices and IC's0 citations
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Performance and Reliability Improvement Trends in Silicon Carbide Power Devices
H. Kono, R. Ohara, Takuma Suzuki, S. Asaba +1 more
2024International Electron Devices Meeting0 citations
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Effects of Ti/Au Layered Structure on Temperature Dependence of Micro-Cantilever Structure Stability
H. Watanabe, Takuma Suzuki, Chun-Yi Chen, T. Chang +6 more
20190 citations
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Effect of RE elements on the growth of superconducting films by LPA-MOD
Takuma Suzuki, R. Kita, Joitiro Fukui, O. Miura
20190 citations
Semantic Scholar
A Study of Temperature Dependence of Ti/Au microcantilever by Multi-layer Metal Technology
Takuma Suzuki, T. Chang, Chun-Yi Chen, T. Konishi +5 more
20170 citations
Semantic Scholar
NUMERICAL EVALUATION ON LOAD CARRYING CAPACITIES OF STEEL BRIDGE PIERS DURING LONG DURATION TIME MOTIONS
T. Kitahara, Y. Kishi, Takuma Suzuki, T. Yamaguchi
20150 citations Open access
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Possible detection of surface melting on solid hydrogen by TOF-SIMS
Takuma Suzuki
20150 citations
Semantic Scholar
Temperature-programmed TOF-SIMS on quench-condensed solid surfaces
Takuma Suzuki
20150 citations
Semantic Scholar
3 kV-class DIMOSFET on 4 H-SiC ( 0001 )
H. Kono, Masaru Furukawa, K. Ariyoshi, Takuma Suzuki +2 more
20120 citations
Semantic Scholar
3kV-class DIMOSFET on 4H-SiC (000-1)
H. Kono, Masaru Furukawa, K. Ariyoshi, Takuma Suzuki +2 more
20120 citations
Semantic Scholar
138 NDE of a 3-D Fatigue Crack by Direct Current Potential Drop Imaging Technique
Takuma Suzuki, H. Tohmyoh, M. Saka, S. Ahmed
20070 citations Open access
Semantic Scholar
Parallel Simulations of Relaxation in Electron Transport in Crossed Electric and Magnetic Fields
Takuma Suzuki, Ikuya Horie, K. Kitamori, K. Maruyama
20030 citations Open access
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Managing the Knowledge Asset by Using XML More Practical Through the Inclusion of Hyper Authoring
Ikuya Horie, Takuma Suzuki, K. Kitamori
20030 citations
Semantic Scholar
Doping of acceptor impurities into ZnO
H. Ko, A. Setiawan, C. Harada, Takuma Suzuki +1 more
2002International Conference on Molecular Bean Epitaxy0 citations
Semantic Scholar
Lattice Gas Model Based Optimization of Plasma-Surface Processes for GaN-Based Compound Growth
Kiyohide Nonokawa, Takuma Suzuki, K. Kitamori, T. Sawada
20010 citations
Semantic Scholar

K. Arai

×8

H. Kono×7

T. Yao×6

C. Harada×5

K. Kitamori×5

H. Goto×4

T. Minegishi×4

A. Setiawan×4