S. McClure

Most-cited papers

Dependence of total dose response of bipolar linear microcircuits on applied dose rate
S. McClure, R. Pease, W. Will, G. Perry
1994131 citations
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Radiation effects in micro-electromechanical systems (MEMS): RF relays
S. McClure, L. Edmonds, R. Mihailovich, A. Johnston +4 more
200293 citations
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Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides
X. Chen, H. Barnaby, Bert Vermeire, K. Holbert +7 more
2007IEEE Transactions on Nuclear Science84 citations
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Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator
R. Pease, S. McClure, J. Gorelick, S. C. Witczak
199874 citations
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A compendium of recent total dose data on bipolar linear microcircuits
R. Pease, W. E. Combs, A. Johnston, T. Carrière +3 more
19961996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference48 citations
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An updated data compendium of enhanced low dose rate sensitive (ELDRS) bipolar linear circuits
R. Pease, S. McClure, A. H. Johnston, J. Gorelick +5 more
20012001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588)47 citations
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Total Dose and Dose Rate Response of an AD590 Temperature Transducer
R. Pease, G. Dunham, J. Seiler, Dale G. Platteter +1 more
2007IEEE Transactions on Nuclear Science42 citations
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Total dose degradation of MEMS optical mirrors
T. Miyahira, H. Becker, S. McClure, L. Edmonds +2 more
200338 citations
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Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode
Georgios Tsiligiannis, L. Dilillo, A. Bosio, P. Girard +6 more
2013IEEE Transactions on Nuclear Science35 citations
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Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits
Philippe C. Adell, R. Pease, H. Barnaby, Bernard Rax +2 more
2009IEEE Transactions on Nuclear Science28 citations
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Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators
S. McClure, J. Gorelick, R. Pease, A. H. Johnston
20002000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)26 citations
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Mechanisms for total dose sensitivity to preirradiation thermal stress in bipolar linear microcircuits
R. Pease, M. Shaneyfelt, P. Winokur, D. Fleetwood +5 more
1997RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)26 citations
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Statistical Model Selection for TID Hardness Assurance
Raymond L. Ladbury, J. Gorelick, S. McClure
2009IEEE Transactions on Nuclear Science24 citations Open access
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Total dose performance of radiation hardened voltage regulators and references
S. McClure, J. Gorelick, R. Pease, B. G. Rax +1 more
20012001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588)24 citations
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Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology
M. Xapsos, C. Stauffer, A. Phan, S. McClure +4 more
2017IEEE Transactions on Nuclear Science23 citations Open access
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Continuing evaluation of bipolar linear devices for total dose dependency and ELDRS effects
S. McClure, J. Gorelick, Candice C. Yui, Bernard G. Rax +1 more
20032003 IEEE Radiation Effects Data Workshop22 citations
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Radiation effects assessment of MRAM devices
Mohamed Elghefari, S. McClure
200816 citations
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Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits
Philippe C. Adell, S. McClure, R. Pease, B. G. Rax +3 more
2007European Conference on Radiation and Its Effects on Components and Systems16 citations
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Catastrophic SEE in high-voltage power MOSFETs
L. Selva, L. Scheick, S. McClure, T. Miyahira +4 more
20032003 IEEE Radiation Effects Data Workshop14 citations
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Total dose bias dependency and ELDRS effects in bipolar linear devices
C. C. Yui, S. McClure, B. G. Rax, J. Lehman +2 more
2002IEEE Radiation Effects Data Workshop14 citations Open access
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An Approach to Single Event Testing of SDRAMs
P. Adell, L. Edmonds, R. McPeak, L. Scheick +1 more
2009IEEE Transactions on Nuclear Science13 citations
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Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen
R. Pease, P. Adell, B. Rax, S. McClure +3 more
2010IEEE Transactions on Nuclear Science10 citations
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ELDRS Characterization for a Very High Dose Mission
R. D. Harris, S. McClure, B. Rax, Dennis O. Thornbourn +3 more
20102010 IEEE Radiation Effects Data Workshop9 citations
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Comparison of TID Effects in Space-Like Variable Dose Rates and Constant Dose Rates
R. D. Harris, S. McClure, Bernard G. Rax, R. Evans +1 more
2008IEEE Transactions on Nuclear Science9 citations
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Recent radiation test results at JPL
B. Pritchard, Bernard G. Rax, S. McClure
20032003 IEEE Radiation Effects Data Workshop9 citations
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Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission
Amanda N. Bozovich, B. Rax, Joe Davila, Duc N. Nguyen +8 more
20182018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018)8 citations
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Continuing radiation evaluation of commercial-off-the-shelf devices for space applications
J. Gorelick, S. McClure
20002000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)7 citations
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Radiation evaluation of plastic encapsulated transistors and microcircuits for use in space applications
J. Gorelick, S. McClure, C. Swink
19991999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463)6 citations
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Heavy Ion radiation assessment of a 100G/200G commercial optical coherent DSP ASIC
Raichelle Aniceto, R. Milanowski, S. McClure, Alexa Aguilar +5 more
2019LASE5 citations Open access
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Total Ionizing Dose ( TID ) and Displacement Damage ( DD ) Effects in Integrated Circuits : Recent Results and the Implications for Emerging Technology
L. Scheick, A. Johnston, P. Adell, F. Irom +1 more
20135 citations
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Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory
S. McClure, G. Allen, F. Irom, L. Scheick +2 more
20102010 IEEE Radiation Effects Data Workshop5 citations
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Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2009-2011
J. N. Bowles-Martinez, D. Thorbourn, B. Rax, Aaron J. Kenna +4 more
20092011 IEEE Radiation Effects Data Workshop5 citations
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Total Ionizing Dose Measurements of a Commercial Samsung NAND Flash Memory for a High Dose Mission
G. Allen, F. Irom, L. Edmonds, Duc N. Nguyen +4 more
20182018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018)4 citations
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Understanding how molecular hydrogen impacts the total dose and dose rate response of linear bipolar circuits
P. Adell, B. Rax, S. McClure, H. Barnaby +2 more
20094 citations
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Degradation of RH1056 parameters at low total dose
R. D. Harris, Bernard G. Rax, S. McClure, A. Johnston
2007European Conference on Radiation and Its Effects on Components and Systems4 citations
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Burn-in effects on total dose radiation sensitivity
J. Gorelick, S. McClure, R. Pease
19981998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385)4 citations
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Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2003 through 2009
A. Kenna, B. Rax, D. Thorbourn, R. D. Harris +1 more
20092009 IEEE Radiation Effects Data Workshop3 citations Open access
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Monte Carlo Evaluation of the Europa Clipper TID Margin Based on the Variability of the Jovian Radiation Environment With Application for Mission Design
A. Andersen, Wousik Kim, S. McClure, I. Jun
2020Space Weather2 citations Open access
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Updated Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission
Stephanie A. Zajac, Amanda N. Bozovich, B. Rax, Joe Davila +7 more
20202020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)2 citations
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Implanted medical devices in the radiation environment of commercial spaceflight.
David P. Reyes, S. McClure, J. Chancellor, R. Blue +2 more
2014Aviation Space and Environmental Medicine2 citations
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Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions
S. McClure, R. D. Harris, Bernard G. Rax, Dennis O. Thorbourn
20122012 IEEE Radiation Effects Data Workshop2 citations
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Total dose degradation of optical MEMS mirrors
T. Miyahira, H. Becker, S. McClure, L. Edmonds +1 more
20032 citations
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Total Dose Testing Methodology for Bipolar Circuits Operating in the Jovian Radiation Environment
P. Adell, S. McClure, B. Rax, D. Thorbourn +4 more
2019IEEE Transactions on Nuclear Science1 citations
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Confidence Level Based Approach to Total Dose Specification for Spacecraft Electronics
M. Xapsos, C. Stauffer, A. Phan, S. McClure +4 more
20171 citations
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Modeling effects of common molecular contaminants on the Euclid infrared detectors
W. Holmes, C. McKenney, R. Barbier, H. Cho +32 more
2016Astronomical Telescopes + Instrumentation1 citations
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TID Test Results for 4th Generation iPad™
S. Guertin, G. Allen, S. McClure, K. Label
2013Radiation Effects Data Workshop1 citations
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EEE parts and materials program for Jupiter mission
S. McClure, G. Arakaki, D. Brinza, I. Jun +8 more
20160 citations
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TID Test Results for 4th Generation iPad(TradeMark)
S. Guertin, G. Allen, S. McClure, K. Label
20130 citations
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The NASA Electronic Parts and Packaging (NEPP) Program - Parts, Packaging, and Radiation Reliability Research on Electronics
S. McClure
20120 citations
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Neural Networks Based Approach to Enhance Space Hardware Reliability
R. Zebulum, A. Thakoor, T. Lu, L. Franco +2 more
20110 citations
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