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F. Irom · SciRah

Researcher profile · Semantic Scholar

F. Irom

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F. Irom — researcher profile on SciRah

h-index: 19
Works: 112
Citations: 1,046

Most-cited papers

Single Event Effect Characterization of High Density Commercial NAND and NOR Nonvolatile Flash Memories
F. Irom, Duc N. Nguyen
2007IEEE Transactions on Nuclear Science92 citations
Semantic Scholar
Single-event upset in the PowerPC750 microprocessor
G. Swift, F. F. Fannanesh, S. Guertin, F. Irom +1 more
200146 citations
Semantic Scholar
Catastrophic Failure in Highly Scaled Commercial NAND Flash Memories
F. Irom, Duc N. Nguyen, M. Bagatin, G. Cellere +2 more
2010IEEE Transactions on Nuclear Science45 citations
Semantic Scholar
Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA
Mehran Amrbar, F. Irom, S. Guertin, G. Allen
2015Radiation Effects Data Workshop43 citations
Semantic Scholar
Space processor radiation mitigation and validation techniques for an 1,800 MIPS processor board
R. Hillman, G. Swift, P. Layton, M. Conrad +2 more
2003Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.36 citations
Semantic Scholar
Effects of Scaling in SEE and TID Response of High Density NAND Flash Memories
F. Irom, Duc N. Nguyen, M. Underwood, A. Virtanen
2010IEEE Transactions on Nuclear Science30 citations
Semantic Scholar
Radiation effects on MRAM
D. Nguyen, F. Irom
2007European Conference on Radiation and Its Effects on Components and Systems30 citations
Semantic Scholar
Frequency dependence of single-event upset in advanced commercial PowerPC microprocessors
F. Irom, F. Farmanesh
2004IEEE Transactions on Nuclear Science30 citations
Semantic Scholar
2015 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory's Radiation Effects Group
G. Allen, L. Scheick, F. Irom, S. Guertin +4 more
2015Radiation Effects Data Workshop29 citations
Semantic Scholar
Guideline for ground radiation testing of microprocessors in the space radiation environment
F. Irom
200829 citations
Semantic Scholar
Properties of the isovector monopole and other giant resonances in pion charge exchange
A. Erell, J. Alster, J. Lichtenstadt, M. Moinester +7 more
198425 citations Open access
Semantic Scholar
Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories
T. Oldham, M. Berg, M. Friendlich, Ted Wilcox +8 more
20102011 IEEE Radiation Effects Data Workshop23 citations Open access
Semantic Scholar
Single-event upset in evolving commercial silicon-on-insulator microprocessor technologies
F. Irom, F. Farmanesh, G. Swift, A. Johnston +1 more
200323 citations
Semantic Scholar
Single-event transients in high-speed comparators
A. Johnston, T. Miyahira, L. Edmonds, F. Irom
200221 citations
Semantic Scholar
Single Event Effect and Total Ionizing Dose Results of Highly Scaled Flash Memories
F. Irom, Duc N. Nguyen, G. Allen
2013Radiation Effects Data Workshop20 citations
Semantic Scholar
Coherent eta -meson production in the reaction pi -+3He--> eta +t.
Jen-Chieh Peng, M. Leitch, J. Bowman, F. Irom +8 more
1989Physical Review Letters17 citations
Semantic Scholar
Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
M. Obryan, K. Label, J. Pellish, Da-Kai Chen +22 more
20092010 IEEE Radiation Effects Data Workshop16 citations Open access
Semantic Scholar
Forward-angle cross sections for pion-nucleon charge exchange between 100 and 150 MeV/c.
D. H. Fitzgerald, H. Baer, J. Bowman, M. Cooper +8 more
1986Physical review. C, Nuclear physics15 citations
Semantic Scholar
Radiation tests of highly scaled high density commercial nonvolatile flash memories
F. Irom, Duc N. Nguyen
200812 citations
Semantic Scholar
Isobaric Analog States in Pion Single-Charge-Exchange Reactions on and above the (3,3) Resonance Energy
U. Sennhauser, E. Piasetzky, H. Baer, J. Bowman +7 more
198312 citations
Semantic Scholar
Destructive events in NAND Flash memories irradiated with heavy ions
M. Bagatin, S. Gerardin, A. Paccagnella, G. Cellere +2 more
2010Microelectronics and reliability11 citations
Semantic Scholar
Catastrophic latchup in a CMOS operational amplifier
F. Irom, T. Miyahira
2005IEEE Transactions on Nuclear Science11 citations
Semantic Scholar
SEE and TID Response of Spansion 512Mb NOR Flash Memory
F. Irom, Duc N. Nguyen
20102011 IEEE Radiation Effects Data Workshop10 citations
Semantic Scholar
Some proton spin observables obtained in p-d elastic scattering at 500 and 800 MeV
A. Rahbar, B. Aas, E. Bleszynski, M. Bleszynski +10 more
198710 citations
Semantic Scholar
Proton polarization observables for the elastic and inelastic scattering of 500 MeV protons from 40Ca and 208Pb
B. Aas, E. Bleszynski, M. Bleszynski, M. Haji-Saeid +12 more
198610 citations
Semantic Scholar
Single-event latchup measurements on COTS electronic devices for use in ISS payloads
F. Irom, G. Allen, Sergeh Vartanian
2017Radiation Effects Data Workshop9 citations
Semantic Scholar
Recent Results for PowerPC Processor and Bridge Chip Testing
S. Guertin, F. Irom
20102010 IEEE Radiation Effects Data Workshop9 citations
Semantic Scholar
Single-event upset in highly scaled commercial silicon-on-insulator PowerPC microprocessors
F. Irom, F. Farmanesh
2005IEEE Transactions on Nuclear Science9 citations
Semantic Scholar
Isobaric-analog-state transitions in pion charge-exchange reactions above the Δ(1232) resonance
S. Rokni, H. Baer, A. G. Bergmann, J. Bowman +12 more
19889 citations
Semantic Scholar
Electron Irradiation of Samsung 8-Gb NAND Flash Memory
F. Irom, L. Edmonds, G. Allen, Wousik Kim +1 more
2018IEEE Transactions on Nuclear Science8 citations
Semantic Scholar
Heavy Ion, Proton and Electron Single-Event Effect Measurements of a Commercial Samsung NAND Flash Memory
F. Irom, G. Allen, D. Sheldon
2016Radiation Effects Data Workshop8 citations
Semantic Scholar
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters
F. Irom, S. Agarwal
20122012 IEEE Radiation Effects Data Workshop8 citations
Semantic Scholar
A Method to Separate Proton Damage in LED and Phototransistor of Optocouplers
F. Irom, L. Edmonds, G. Allen, B. Rax
2018IEEE Transactions on Nuclear Science7 citations
Semantic Scholar
Proton Displacement Damage Measurements in Commercial Optocouplers
F. Irom, G. Allen, B. Rax
2015Radiation Effects Data Workshop7 citations
Semantic Scholar
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers
F. Irom, S. Agarwal, Mehran Amrbar
2014Radiation Effects Data Workshop7 citations
Semantic Scholar
Measurements of Radiation Effects on Optoelectronics Conducted by the Jet Propulsion Laboratory
Tetsuo Miyahira, F. Irom, A. Johnston
20062006 IEEE Radiation Effects Data Workshop7 citations
Semantic Scholar
Single Event Latchup Results for COTS Devices Used on SmallSat Missions
Sergeh Vartanian, F. Irom, G. Allen, Wilson P. Parker +1 more
20202020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)6 citations
Semantic Scholar
Heavy Ion Induced Single-Event Latchup Screening of Integrated Circuits Using Commercial Off-the-Shelf Evaluation Boards
G. Allen, F. Irom, L. Scheick, Sergeh Vartanian +1 more
2016Radiation Effects Data Workshop6 citations
Semantic Scholar
Radiation Tests of Highly Scaled, High-Density, Commercial, Nonvolatile NAND Flash Memories - Update 2012
F. Irom, G. Allen
20126 citations
Semantic Scholar
Test Results of Proton Single-Event Effects Conducted by the Jet Propulsion Laboratory
G. Allen, F. Irom, Sergeh Vartanian
20052019 IEEE Radiation Effects Data Workshop6 citations
Semantic Scholar
Single-event upset in power-PC processors
F. Irom, A. Johnston, G. Swift
20026 citations
Semantic Scholar
Cross sections and analyzing powers in the (p,d) reaction around 500 MeV
H. Ohnuma, F. Irom, B. Aas, M. Haji-Saeid +8 more
19846 citations
Semantic Scholar
Compendium of single event transient (SET) and total ionizing dose (TID) test results for commonly used voltage comparators
Amanda N. Bozovich, F. Irom
2017Radiation Effects Data Workshop5 citations
Semantic Scholar
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Digital to Analog Converters
F. Irom, S. Agarwal
2015Radiation Effects Data Workshop5 citations
Semantic Scholar
Total Ionizing Dose ( TID ) and Displacement Damage ( DD ) Effects in Integrated Circuits : Recent Results and the Implications for Emerging Technology
L. Scheick, A. Johnston, P. Adell, F. Irom +1 more
20135 citations
Semantic Scholar
Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory
S. McClure, G. Allen, F. Irom, L. Scheick +2 more
20102010 IEEE Radiation Effects Data Workshop5 citations
Semantic Scholar
Comparison of TID response and SEE characterization of single- and multi-level high density NAND flash memories
F. Irom, Duc N. Nguyen, R. Harboe-Sørensen, A. Virtanen
2009European Conference on Radiation and Its Effects on Components and Systems5 citations
Semantic Scholar
Frequency Dependence of Single-Event Upset in Highly Advanced PowerPC Microprocessors
F. Irom, F. Farmanesh, M. White, C. Kouba
20065 citations
Semantic Scholar
High spin states in Si28 and Ni58
N. Hintz, M. Franey, M. Gazzaly, D. Cook +11 more
19845 citations
Semantic Scholar
Single-Event Latchup Measurements on Wireless and Powerline Network Communication Devices for Use in Mars Missions
F. Irom, Sergeh Vartanian, G. Allen
20182018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018)4 citations
Semantic Scholar

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