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C. Carabasse · SciRah

Researcher profile · Semantic Scholar

C. Carabasse

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C. Carabasse — researcher profile on SciRah

h-index: 18
Works: 52
Citations: 1,036

Most-cited papers

Demonstration of BEOL-compatible ferroelectric Hf0.5Zr0.5O2 scaled FeRAM co-integrated with 130nm CMOS for embedded NVM applications
T. Francois, C. Pellissier, S. Slesazeck, V. Havel +18 more
2019International Electron Devices Meeting109 citations Open access
Semantic Scholar
Understanding RRAM endurance, retention and window margin trade-off using experimental results and simulations
C. Nail, G. Molas, P. Blaise, G. Piccolboni +18 more
2016International Electron Devices Meeting101 citations
Semantic Scholar
Experimental and theoretical study of electrode effects in HfO2 based RRAM
C. Cagli, J. Buckley, V. Jousseaume, T. Cabout +29 more
2011International Electron Devices Meeting83 citations Open access
Semantic Scholar
Sb-doped GeS2 as performance and reliability booster in Conductive Bridge RAM
E. Vianello, G. Molas, F. Longnos, Philippe Blaise +18 more
2012International Electron Devices Meeting46 citations
Semantic Scholar
A stacked SONOS technology, up to 4 levels and 6nm crystalline nanowires, with Gate-All-Around or independent gates (φ-Flash), suitable for full 3D integration
Arnaud Hubert, E. Nowak, K. Tachi, V. Maffini-Alvaro +14 more
2009International Electron Devices Meeting45 citations
Semantic Scholar
Investigation of the physical mechanisms governing data-retention in down to 10nm nano-trench Al2O3/CuTeGe conductive bridge RAM (CBRAM)
J. Guy, G. Molas, E. Vianello, F. Longnos +18 more
20132013 IEEE International Electron Devices Meeting40 citations
Semantic Scholar
Impact of area scaling on the ferroelectric properties of back-end of line compatible Hf0.5Zr0.5O2 and Si:HfO2-based MFM capacitors
T. Francois, L. Grenouillet, J. Coignus, Nicolas Vaxelaire +11 more
202138 citations Open access
Semantic Scholar
Relationship between mobility and high-k interface properties in advanced Si and SiGe nanowires
K. Tachi, M. Cassé, Doyoung Jang, C. Dupre +12 more
2009International Electron Devices Meeting37 citations
Semantic Scholar
Investigation of the potentialities of Vertical Resistive RAM (VRRAM) for neuromorphic applications
G. Piccolboni, G. Molas, Jean-Michel Portal, R. Coquand +14 more
2015International Electron Devices Meeting34 citations Open access
Semantic Scholar
Experimental study on carrier transport limiting phenomena in 10 nm width nanowire CMOS transistors
K. Tachi, M. Cassé, S. Barraud, C. Dupre +11 more
2010International Electron Devices Meeting34 citations
Semantic Scholar
Nanosecond Laser Anneal (NLA) for Si-implanted HfO2 Ferroelectric Memories Integrated in Back-End Of Line (BEOL)
L. Grenouillet, T. Francois, J. Coignus, S. Kerdilès +15 more
20202020 IEEE Symposium on VLSI Technology32 citations
Semantic Scholar
On the impact of Ag doping on performance and reliability of GeS2-based Conductive Bridge Memories
E. Vianello, C. Cagli, G. Molas, E. Souchier +10 more
2012European Solid-State Device Research Conference31 citations
Semantic Scholar
Experimental and theoretical understanding of Forming, SET and RESET operations in Conductive Bridge RAM (CBRAM) for memory stack optimization
J. Guy, G. Molas, P. Blaise, C. Carabasse +17 more
20142014 IEEE International Electron Devices Meeting30 citations
Semantic Scholar
16kbit HfO2:Si-based 1T-1C FeRAM Arrays Demonstrating High Performance Operation and Solder Reflow Compatibility
T. Francois, J. Coignus, A. Makosiej, B. Giraud +17 more
2021International Electron Devices Meeting29 citations
Semantic Scholar
16kbit 1T1R OxRAM arrays embedded in 28nm FDSOI technology demonstrating low BER, high endurance, and compatibility with core logic transistors
L. Grenouillet, N. Castellani, A. Persico, Valentina Meli +26 more
2021International Memory Workshop28 citations
Semantic Scholar
Comparative Scalability of PVD and CVD TiN on HfO2 as a Metal Gate Stack for FDSOI cMOSFETs down to 25nm Gate Length and Width
F. Andrieu, O. Faynot, X. Garros, D. Lafond +24 more
2006International Electron Devices Meeting28 citations
Semantic Scholar
Study of resistive random access memory based on TiN/TaOx/TiN integrated into a 65nm advanced complementary metal oxide semiconductor technology
T. Diokh, E. Le-Roux, S. Jeannot, C. Cagli +9 more
201326 citations
Semantic Scholar
In-depth investigation of programming and reading operations in RRAM cells integrated with Ovonic Threshold Switching (OTS) selectors
M. Alayan, E. Vianello, G. Navarro, C. Carabasse +12 more
2017International Electron Devices Meeting20 citations
Semantic Scholar
BEOL Integrated Ferroelectric HfO₂-Based Capacitors for FeRAM: Extrapolation of Reliability Performance to Use Conditions
R. Alcala, M. Materano, P. D. Lomenzo, L. Grenouillet +8 more
2022IEEE Journal of the Electron Devices Society17 citations Open access
Semantic Scholar
BEOL Integrated Ferroelectric HfO2 based Capacitors for FeRAM: Extrapolation of Reliability Performance to Use Conditions
R. Alcala, M. Materano, P. D. Lomenzo, L. Grenouillet +8 more
2022IEEE Electron Devices Technology and Manufacturing Conference17 citations
Semantic Scholar
High-Performance Operation and Solder Reflow Compatibility in BEOL-Integrated 16-kb HfO2: Si-Based 1T-1C FeRAM Arrays
T. Francois, J. Coignus, A. Makosiej, B. Giraud +17 more
2022IEEE Transactions on Electron Devices16 citations
Semantic Scholar
Interface Engineering of Ag-${\rm GeS}_{2}$ -Based Conductive Bridge RAM for Reconfigurable Logic Applications
G. Palma, E. Vianello, O. Thomas, Manan Suri +8 more
2014IEEE Transactions on Electron Devices15 citations
Semantic Scholar
Effect of the Active Layer Thickness and Temperature on the Switching Kinetics of GeS2-Based Conductive Bridge Memories
G. Palma, E. Vianello, G. Molas, C. Cagli +9 more
201214 citations Open access
Semantic Scholar
Performance assessment of BEOL-integrated HfO2-based ferroelectric capacitors for FeRAM memory arrays
L. Grenouillet, T. Francois, J. Coignus, N. Vaxelaire +5 more
2020IEEE Silicon Nanoelectronics Workshop12 citations
Semantic Scholar
Scalability of split-gate charge trap memories down to 20nm for low-power embedded memories
L. Masoero, G. Molas, Francesca Brun, M. Gely +18 more
2011International Electron Devices Meeting12 citations Open access
Semantic Scholar
Memory and Energy Storage Dual Operation in Chalcogenide-Based CBRAM
Daeseok Lee, S. Oukassi, G. Molas, C. Carabasse +2 more
2017IEEE Journal of the Electron Devices Society11 citations Open access
Semantic Scholar
Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited)
L. Grenouillet, J. Barbot, J. Laguerre, S. Martin +10 more
2023IEEE International Reliability Physics Symposium10 citations
Semantic Scholar
1S1R Optimization for High‐Frequency Inference on Binarized Spiking Neural Networks
Joel Minguet Lopez, Q. Rafhay, M. Dampfhoffer, L. Reganaz +13 more
202210 citations Open access
Semantic Scholar
Low voltage hot-carrier programming of ultra-scaled SOI finflash memories
J. Razafmdramora, L. Perniola, C. Jahan, P. Scheiblin +8 more
2007European Solid-State Device Research Conference9 citations
Semantic Scholar
Crosspoint Memory Arrays: Principle, Strengths and Challenges
G. Molas, D. A. Robayo, J. M. Lopez, L. Grenouillet +10 more
2020International Memory Workshop8 citations
Semantic Scholar
Reliability and Variability of 1S1R OxRAM-OTS for High Density Crossbar Integration
D. A. Robayo, D. Deleruyelle, E. Vianello, N. Castellani +14 more
2019International Electron Devices Meeting8 citations
Semantic Scholar
Guidance to reliability improvement in CBRAM using advanced KMC modelling
J. Guy, G. Molas, C. Cagli, M. Bernard +6 more
2017IEEE International Reliability Physics Symposium8 citations
Semantic Scholar
On disturb immunity and P/E kinetics of Sb-doped GeS2/Ag conductive bridge memories
F. Longnos, E. Vianello, G. Molas, G. Palma +6 more
20132013 5th IEEE International Memory Workshop8 citations
Semantic Scholar
Memory Window in Si:HfO2 FeRAM arrays: Performance Improvement and Extrapolation at Advanced Nodes
J. Laguerre, M. Bocquet, O. Billoint, Simon Martin +6 more
2023International Memory Workshop7 citations Open access
Semantic Scholar
Hybrid FeRAM/RRAM Synaptic Circuit Enabling On-Chip Inference and Learning at the Edge
M. Martemucci, F. Rummens, T. Hirtzlin, S. Martin +11 more
2023International Electron Devices Meeting7 citations Open access
Semantic Scholar
Impact of Sb doping on power consumption and retention reliability of GeS2 based conductive bridge random access memory
J. Guy, G. Molas, E. Vianello, C. Carabasse +8 more
20147 citations
Semantic Scholar
Dynamics of polarization loss and imprint in bilayer ferroelectric tunnel junctions
J. Barbot, R. Fontanini, M. Segatto, J. Coignus +6 more
2023Journal of Applied Physics6 citations
Semantic Scholar
Ge-Se-Sb-N-based OTS scaling perspectives for high-density 1 S1R crossbar arrays
Joel Minguet Lopez, N. Castellani, L. Grenouillet, L. Reganaz +9 more
2021International Memory Workshop6 citations
Semantic Scholar
Integration of OTS based back-end selector with HfO2 OxRAM for crossbar arrays
D. A. Robayo, Gilbert Sassine, L. Grenouillet, C. Carabasse +13 more
2019International Memory Workshop6 citations
Semantic Scholar
Vertical CBRAM (V-CBRAM): From Experimental Data to Design Perspectives
G. Piccolboni, M. Parise, G. Molas, Alexandre Levisse +14 more
2016International Memory Workshop6 citations
Semantic Scholar
1S1R sub-threshold operation in Crossbar arrays for low power BNN inference computing
Joel Minguet Lopez, F. Rummens, L. Reganaz, A. Heraud +16 more
2022International Memory Workshop5 citations
Semantic Scholar
Interplay between charge trapping and polarization switching in MFDM stacks evidenced by frequency-dependent measurements
J. Barbot, J. Coignus, Nicolas Vaxelaire, C. Carabasse +6 more
2022European Solid-State Circuits Conference4 citations
Semantic Scholar
Optimization of RRAM and OTS selector for advanced low voltage CMOS compatibility
J. M. Lopez, D. Alfaro Robayo, L. Grenouillet, C. Carabasse +12 more
2020International Memory Workshop4 citations
Semantic Scholar
In-line transmission electron microscopy for micro and nanotechnologies research and development
V. Delaye, F. Andrieu, F. Aussenac, O. Faynot +5 more
20084 citations
Semantic Scholar
In-line FIB TEM sample preparation induced effects on advanced fully depleted silicon on insulator transistors
V. Delaye, F. Andrieu, F. Aussenac, C. Carabasse
20084 citations
Semantic Scholar
Investigation of HfO2/Ti based vertical RRAM - Performances and variability
G. Piccolboni, G. Molas, C. Carabasse, J. Nodin +12 more
2014Non-Volatile Memory Technology Symposium3 citations
Semantic Scholar
Physical Understanding of Program Injection and Consumption in Ultra-Scaled SiN Split-Gate Memories
L. Masoero, G. Molas, V. Della Marca, M. Gely +15 more
20122012 4th IEEE International Memory Workshop3 citations Open access
Semantic Scholar
Innovative switching mechanism, performance investigations and scaling effects in a-V2O3 based ReRAM devices
K. Veyret, Léo Laborie, R. Bon, Gabriele Navaro +5 more
2024IEEE Silicon Nanoelectronics Workshop0 citations
Semantic Scholar
1S1R Sub-Threshold Operation in Crossbar Arrays for Neural Networks Hardware Implementation
Joel Minguet Lopez, M. Dampfhoffer, T. Hirtzlin, L. Reganaz +12 more
2023International Conference on Mixed Design of Integrated Circuits and Systems0 citations Open access
Semantic Scholar
Co-integration of ReRAM with OTS back-end selector for high density Crosspoint arrays
G. Molas, Joel Minguet Lopez, L. Grenouillet, C. Carabasse +11 more
2021Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials0 citations
Semantic Scholar

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