Malvika

Temperature Sensitivity and Reliability in Asymmetric 3D GAA Nanowire NCFETs: Beyond Room Temperature for Next-Gen Nanoelectronics

Malvika, Ashutosh Srivastava, Divya Srivastava, Prabhat Singh +2 more

20252025 1st IEEE Uttar Pradesh Section Women in Engineering International Conference on Electrical Electronics and Computer Engineering (UPWIECON)0 citations

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Malvika

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Temperature Sensitivity and Reliability in Asymmetric 3D GAA Nanowire NCFETs: Beyond Room Temperature for Next-Gen Nanoelectronics

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