N. Dellby

Most-cited papers

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
O. Krivanek, M. Chisholm, V. Nicolosi, T. Pennycook +8 more
2010Nature1,278 citations
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Vibrational spectroscopy in the electron microscope
O. Krivanek, T. Lovejoy, N. Dellby, T. Aoki +8 more
2014Nature666 citations Open access
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Gentle STEM: ADF imaging and EELS at low primary energies $
O. Krivanek, N. Dellby, M. Murfitt, M. Chisholm +3 more
2010169 citations
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Single-defect phonons imaged by electron microscopy
Xing-Xu Yan, Cheng-Yan Liu, Chaitanya A. Gadre, Lei Gu +7 more
2021Nature166 citations Open access
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Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope
J. Hachtel, Jingsong Huang, Ilja Popovs, Santa Jansone-Popova +6 more
2019Science162 citations
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Progress in ultrahigh energy resolution EELS.
O. Krivanek, N. Dellby, J. Hachtel, J. Idrobo +8 more
2019Ultramicroscopy152 citations Open access
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Nanoscale momentum-resolved vibrational spectroscopy
F. Hage, R. Nicholls, J. R. Yates, D. McCulloch +5 more
2018Science Advances144 citations Open access
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Monochromated STEM with a 30 meV-wide, atom-sized electron probe.
O. Krivanek, T. Lovejoy, N. Dellby, R. Carpenter
2013Microscopy117 citations Open access
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Damage-free vibrational spectroscopy of biological materials in the electron microscope
Peter Rez, T. Aoki, K. March, Dvir Gur +5 more
2016Nature Communications109 citations Open access
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Single atom identification by energy dispersive x-ray spectroscopy
T. Lovejoy, Q. Ramasse, M. Falke, A. Kaeppel +4 more
201299 citations
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Temperature Measurement by a Nanoscale Electron Probe using Energy Gain and Loss Spectroscopy
J. Idrobo, A. Lupini, Tianli Feng, R. Unocic +6 more
2018Microscopy and Microanalysis95 citations Open access
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Hybrid pixel direct detector for electron energy loss spectroscopy.
B. Plotkin-Swing, G. Corbin, S. De Carlo, N. Dellby +8 more
2020Ultramicroscopy93 citations Open access
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Vibrational Spectroscopy of Water with High Spatial Resolution
J. Jokisaari, J. Hachtel, Xuan Hu, Arijita Mukherjee +8 more
2018Advances in Materials60 citations
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Towards sub-10 meV energy resolution STEM-EELS
O. Krivanek, T. Lovejoy, M. Murfitt, G. Skone +2 more
201448 citations Open access
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Dedicated STEM for 200 to 40 keV operation
N. Dellby, N. J. Bacon, P. Hrnčiřík, M. Murfitt +3 more
201141 citations
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Aberration‐corrected STEM for atomic‐resolution imaging and analysis
O. Krivanek, T. Lovejoy, N. Dellby
2015Journal of Microscopy29 citations
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Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python.
C. Meyer, N. Dellby, J. Hachtel, T. Lovejoy +2 more
2019Microscopy and Microanalysis28 citations Open access
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Scanning transmission electron microscopy: Albert Crewe's vision and beyond.
O. Krivanek, M. Chisholm, M. Murfitt, N. Dellby
2012Ultramicroscopy27 citations
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Advances in Ultra-High Energy Resolution STEM-EELS
T. Lovejoy, G. Corbin, N. Dellby, M. Hoffman +1 more
2018Microscopy and Microanalysis25 citations Open access
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Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits
O. Krivanek, Wu Zhou, M. Chisholm, J. Idrobo +3 more
201216 citations
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Toward Single Mode, Atomic Size Electron Vortex Beams
O. Krivanek, J. Rusz, J. Idrobo, T. Lovejoy +1 more
2014Microscopy and Microanalysis15 citations
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Atomic-Resolution STEM at Low Primary Energies
O. Krivanek, M. Chisholm, N. Dellby, M. Murfitt
201115 citations
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Toward Atomic-Scale Tomography: The ATOM Project
T. Kelly, Michael K. Miller, K. Rajan, S. Ringer +3 more
2011Microscopy and Microanalysis12 citations Open access
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Ultra-High Vacuum Aberration-Corrected STEM for in-situ studies
M. Hotz, G. Corbin, N. Dellby, O. Krivanek +2 more
2016Microscopy and Microanalysis11 citations Open access
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Individual heteroatom identification with X-ray spectroscopy
R. Stroud, T. Lovejoy, M. Falke, N. Bassim +8 more
201611 citations Open access
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100,000 Diffraction Patterns per Second with Live Processing for 4D-STEM
B. Plotkin-Swing, B. Haas, A. Mittelberger, N. Dellby +10 more
2022Microscopy and Microanalysis10 citations
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Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment
R. Nicholls, F. Hage, J. R. Yates, D. McCulloch +6 more
2015Microscopy and Microanalysis10 citations Open access
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Hydrogen Analysis by Ultra-High Energy Resolution EELS
H. Cohen, P. Rez, T. Aoki, P. Crozier +8 more
2015Microscopy and Microanalysis10 citations Open access
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Brief history of the Cambridge STEM aberration correction project and its progeny.
L. Brown, Philip E. Batson, N. Dellby, O. Krivanek
2015Ultramicroscopy9 citations
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Improving the STEM Spatial Resolution Limit
O. Krivanek, A. Bleloch, N. Dellby, T. Lovejoy +2 more
2018Microscopy and Microanalysis8 citations Open access
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Optimizing the Nion STEM for In-Situ Experiments
M. Hotz, G. Corbin, N. Dellby, T. Lovejoy +7 more
2018Microscopy and Microanalysis8 citations Open access
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Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV.
N. Dellby, S. Quillin, O. Krivanek, P. Hrnčiřík +3 more
2023Microscopy and Microanalysis7 citations Open access
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High-Fidelity 4D-STEM Enabled by Live Processing at 15’000 Detector Frames Per Second
B. Haas, A. Mittelberger, C. Meyer, B. Plotkin-Swing +4 more
2021Microscopy and Microanalysis7 citations
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Ultra-high Energy Resolution EELS
N. Dellby, T. Lovejoy, G. Corbin, N. Johnson +6 more
2020Microscopy and Microanalysis7 citations Open access
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Emergence of point defect states in a plasmonic crystal
H. Saito, H. Lourenço-Martins, N. Bonnet, Xiao-Yan Li +5 more
20196 citations Open access
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Ultra-High Energy Resolution EELS
T. Lovejoy, N. J. Bacon, A. Bleloch, N. Dellby +2 more
2017Microscopy and Microanalysis6 citations Open access
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Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements
T. Lovejoy, N. Dellby, T. Aoki, G. Corbin +3 more
20146 citations Open access
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Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors
N. Dellby, G. Corbin, Z. Dellby, T. Lovejoy +3 more
20146 citations Open access
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Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces
M. Varela, J. Gázquez, A. Lupini, Julia T. Luck +9 more
20106 citations
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Ultra-high Energy Resolution EELS and 4D STEM at Cryogenic Temperatures.
B. Plotkin-Swing, A. Mittelberger, B. Haas, J. Idrobo +7 more
2023Microscopy and Microanalysis5 citations Open access
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Aberration correction in the STEM
O. Krivanek, N. Dellby, A. Spence, R. Camps +1 more
2022Electron Microscopy and Analysis 19975 citations
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Exploring phonon signals by high energy / high spatial resolution EELS
O. Krivanek, N. Dellby, T. Lovejoy, N. J. Bacon +10 more
20145 citations Open access
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Using Nion Swift for Data Collection, Analysis and Display
C. Meyer, N. Dellby, Z. Dellby, T. Lovejoy +3 more
20145 citations Open access
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Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM.
M. Hotz, J. Martis, T. Radlička, N. J. Bacon +6 more
2023Microscopy and Microanalysis4 citations Open access
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Hybrid Pixel EELS Detector: Low Noise, High Speed, and Large Dynamic Range
B. Plotkin-Swing, T. Lovejoy, N. Dellby, G. Corbin +6 more
2020Microscopy and Microanalysis4 citations Open access
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Progress in Ultra-High Energy Resolution EELS
T. Lovejoy, G. Corbin, N. Dellby, N. Johnson +3 more
2019Microscopy and Microanalysis4 citations Open access
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Erratum: Damage-free vibrational spectroscopy of biological materials in the electron microscope
P. Rez, T. Aoki, K. March, Dvir Gur +5 more
2016Nature Communications4 citations Open access
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Monochromated STEM with high energy and spatial resolutions
O. Krivanek, T. Lovejoy, G. Corbin, N. Dellby +4 more
2012Microscopy and Microanalysis4 citations
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Open-Source Phase Reconstructions of Focused-Probe 4D-STEM Data with Near-Ideal Direct-Electron Detection
T. Susi, N. Dellby, R. Hayner, Christoph Hofer +6 more
2024Microscopy and Microanalysis3 citations
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Atomic Resolution Secondary Electron Imaging of Top and Bottom Surfaces
B. Plotkin-Swing, J. Martis, C. Su, M. Hotz +4 more
2024Microscopy and Microanalysis3 citations
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