Osamu Yoshitake

Most-cited papers

1. Annealing Effects on Ge/SiO2 Interface Structure in Wafer-Bonded Germanium-on-Insulator Substrates

   Osamu Yoshitake, J. Kikkawa, Yoshiaki Nakamura, E. Toyoda +3 more

   20108 citations Open access

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2. Electrical characterization of wafer-bonded Ge(111)-on-insulator substrates using four-point-probe pseudo-metal-oxide-semiconductor field-effect transistor method

   K. Minami, Yoshiaki Nakamura, S. Yamasaka, Osamu Yoshitake +3 more

   20127 citations

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3. Improvement effect of electrical properties in post‐annealed wafer‐bonded Ge(001)‐OI substrate

   S. Yamasaka, Yoshiaki Nakamura, Osamu Yoshitake, J. Kikkawa +2 more

   20140 citations

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4. Improvement Effect of Electrical Properties in Post-Annealed Wafer-Bonded Ge(001)-OI Substrate

   Shuto Yamasaka, Yoshiaki Nakamura, Osamu Yoshitake, J. Kikkawa +2 more

   20122012 International Silicon-Germanium Technology and Device Meeting (ISTDM)0 citations

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