Soo-jin Hong

Most-cited papers

1. Impact of the crystallization of the high-k dielectric gate oxide on the positive bias temperature instability of the n-channel metal-oxide-semiconductor field emission transistor

   Han-Jin Lim, Young-Kuk Kim, I. Jeon, J. Yeo +6 more

   201310 citations

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2. Ultra Shallow Junction Formation Using Plasma Doping and Laser Annealing for Sub-65 nm Technology Nodes

   G. Yon, G. Buh, T. Park, Soo-jin Hong +3 more

   20058 citations Open access

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3. Void free and low stress shallow trench isolation technology using P-SOG for sub 0.1 /spl mu/m device

   J. Heo, Soo-jin Hong, D. Ahn, H. Cho +5 more

   20022002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303)7 citations

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4. Data Retention Time and Electrical Characteristics of Cell Transistor According to STI Materials in 90 ㎚ DRAM

   Sounghun Shin, Sun-Ghil Lee, Youngsik Kim, J. Heo +10 more

   20036 citations

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5. An fMRI study of neuronal interactions in face-selective areas of the brain.

   Yul-Wan Sung, Sang-Han Choi, Soo-jin Hong, Uk-Soo Choi +2 more

   2010Brain Research5 citations

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6. Ultrathin gate oxide with a reduced transition layer grown by plasma-assisted oxidation

   S. Hyun, G. Buh, Soo-jin Hong, Bon-won Koo +6 more

   20045 citations

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7. The P-SOG filling Shallow Trench Isolation technology for sub-70 nm device

   J. Heo, Soo-jin Hong, G. Yon, Y. Shin +3 more

   20032003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407)3 citations

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8. Improvement of data retention time using DRAM cell with metallic shield embedded (MSE)-STI for 90nm technology node and beyond

   Sun-Ghil Lee, Soo-jin Hong, Jae-joon Oh, Yong-Jin Choi +5 more

   2003ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003.2 citations

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9. A strategy for long data retention time of 512 Mb DRAM with 0.12 /spl mu/m design rule

   Hyung Soo Uh, June-Woo Lee, Y. Ahn, Sun-Ghil Lee +6 more

   20012001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184)2 citations

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10. Electrical analysis on the drain current of the ultra shallow junction by laser annealing

    Soo-jin Hong, Young Pil Kim, J. Heo, Gook-Hyun Yon +4 more

    2004Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)1 citations

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11. New technologies in isolation and capacitor process for sub 0.1/spl mu/m DRAM

    U. Chung, C. Yoo, Soo-jin Hong

    20032003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672)0 citations

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