D. Govoni

Most-cited papers

1. On the resolution of semiconductor multilayers with a scanning electron microscope

   P. Merli, A. Migliori, M. Nacucchi, D. Govoni +1 more

   199523 citations

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2. Drawbacks to using NIST electromigration test-structures to test bamboo metal lines

   I. De Munari, A. Scorzoni, F. Tamarri, D. Govoni +2 more

   199422 citations Open access

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3. Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry

   A. Armigliato, M. Servidori, F. Cembali, R. Fabbri +10 more

   199221 citations Open access

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4. Images of grain boundaries in polycrystalline silicon solar cells by electron and ion beam induced charge collection

   C. Donolato, R. Nipoti, D. Govoni, G. Egeni +2 more

   199611 citations

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5. A study of He+ ion-induced damage in silicon by quantitative analysis of charge collection efficiency data

   R. Nipoti, C. Donolato, D. Govoni, P. Rossi +2 more

   19989 citations

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6. Electron and ion beam analysis of composition and strain in Si-xGex/Si heterostructures

   A. Armigliato, D. Govoni, R. Balboni, S. Frabboni +3 more

   19945 citations Open access

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7. Excimer Laser Amorphous Silicon Film Crystallization: A Study of Time Resolved Reflectivity Measurements

   C. Summonte, M. Bianconi, D. Govoni

   19933 citations

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8. Effect of Chlorine Implantation on Phosphorus Predeposition in Silicon

   S. Solmi, A. Armigliato, D. Govoni, R. Lotti +3 more

   1985June 163 citations

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9. Resolution of Semiconductor Multilayers using Backscattered Electrons in Scanning Electron Microscopy

   D. Govoni, P. Merli, A. Migliori, M. Nacucchi

   19952 citations Open access

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10. Arsenic ion implantation through Mo and Mo silicide layers for shallow junction formation

    R. Angelucci, S. Solmi, A. Armigliato, E. Gabilli +3 more

    19922 citations

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11. A color video presentation of simulated high resolution lattice images

    P. Venturi, A. Armigliato, A. Mazzone, D. Govoni

    19832 citations

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12. As and B Ion Implantation Through Mo and into Mo-Silicide Layers for Shallow Junction Formation

    R. Angelucci, M. Merli, S. Solmi, A. Armigliato +3 more

    19891 citations

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13. Characterization of TiN films obtained by ion implantation

    A. Armigliato, A. Garulli, D. Govoni, P. Ostoja

    20200 citations

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14. Energy transfer dynamics in isolated and colliding highly vibrationally excited molecules. Technical report, November 1991-October 1994

    F. Crim, M. B. Randunsky, J. Booze, D. Govoni +1 more

    19950 citations

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15. Observation of semiconductor superstructures with backscattered electrons in a scanning electron microscope

    A. Bosacchi, S. Franchi, D. Govoni, G. Mattei +3 more

    19940 citations

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16. Gate oxide thinning as related to doping effects

    P. Bellutti, C. Claeys, I. Debusschere, F. Corticelli +1 more

    1990Transactions on Emerging Telecommunications Technologies0 citations

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