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M. Postek · SciRah

Researcher profile · Semantic Scholar

M. Postek

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M. Postek — researcher profile on SciRah

h-index: 34
Works: 337
Citations: 4,382

Most-cited papers

Development of the metrology and imaging of cellulose nanocrystals
M. Postek, A. Vladár, J. Dagata, N. Farkas +7 more
2011126 citations
Semantic Scholar
Scanning-helium-ion-beam lithography with hydrogen silsesquioxane resist
D. Winston, B. Cord, B. Ming, D. Bell +7 more
2009121 citations Open access
Semantic Scholar
Nanoscale reference materials for environmental, health and safety measurements: needs, gaps and opportunities
A. Stefaniak, V. Hackley, G. Roebben, K. Ehara +6 more
2012Nanotoxicology110 citations
Semantic Scholar
Does Your SEM Really Tell the Truth?—How Would You Know? Part 4: Charging and its Mitigation
M. Postek, A. Vladár
2015SPIE Scanning Microscopies56 citations Open access
Semantic Scholar
Sample preparation protocols for realization of reproducible characterization of single-wall carbon nanotubes
J. Decker, A. H. Hight Walker, K. Bosnick, C. Clifford +14 more
200945 citations Open access
Semantic Scholar
Does your SEM really tell the truth?--How would you know? Part 1.
M. Postek, A. Vladár
2013Scanning44 citations
Semantic Scholar
Review of current progress in nanometrology with the helium ion microscope
M. Postek, A. Vladár, C. Archie, B. Ming
201141 citations Open access
Semantic Scholar
Does your SEM really tell the truth? How would you know? Part 2.
M. Postek, A. Vladár, K. P. Purushotham
2014Scanning40 citations Open access
Semantic Scholar
Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift
P. Čižmár, A. Vladár, M. Postek
2009Microscopy and Microanalysis37 citations Open access
Semantic Scholar
Modeling for accurate dimensional scanning electron microscope metrology: then and now.
M. Postek, A. Vladár
2011Scanning32 citations
Semantic Scholar
On the Sub-Nanometer Resolution of Scanning Electron and Helium Ion Microscopes
A. Vladár, M. Postek, B. Ming
2009Microscopy Today32 citations Open access
Semantic Scholar
10nm three-dimensional CD-SEM metrology
A. Vladár, J. Villarrubia, J. Chawla, B. Ming +3 more
2014Advanced Lithography28 citations
Semantic Scholar
Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturing
M. Postek, D. Poster, A. Vladár, Mark S. Driscoll +3 more
2017Radiation Physics and Chemistry26 citations Open access
Semantic Scholar
Ultraviolet Radiation Technologies and Healthcare-Associated Infections: Standards and Metrology Needs
D. Poster, C. Miller, R. Martinello, Norman Horn +4 more
2021Journal of Research of the National Institute of Standards and Technology24 citations Open access
Semantic Scholar
Contamination-free imaging by electron induced carbon volatilization in environmental scanning electron microscopy
M. Toth, C. Lobo, M. Lysaght, A. Vladár +1 more
200924 citations
Semantic Scholar
Optimization of accurate SEM imaging by use of artificial images
P. Čižmár, A. Vladár, M. Postek
2009Scanning Microscopies24 citations
Semantic Scholar
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope
M. Postek, A. Vladár, J. Villarrubia, A. Muto
2016Microscopy and Microanalysis15 citations Open access
Semantic Scholar
3D Monte Carlo modeling of the SEM: Are there applications to photomask metrology?
J. Villarrubia, A. Vladár, M. Postek
2014Other Conferences15 citations
Semantic Scholar
Can we get 3D-CD metrology right?
A. Vladár, P. Čižmár, J. Villarrubia, M. Postek
2012Advanced Lithography15 citations Open access
Semantic Scholar
Reference material (RM) 8820: a versatile new NIST standard for nanometrology
M. Postek, A. Vladár, W. Keery, M. Bishop +2 more
2010Advanced Lithography15 citations Open access
Semantic Scholar
Innovative Approaches to Combat Healthcare-Associated Infections Using Efficacy Standards Developed Through Industry and Federal Collaboration
D. Poster, C. Miller, Y. Obeng, M. Postek +2 more
2018NanoScience + Engineering14 citations Open access
Semantic Scholar
Strategies for nanoscale contour metrology using critical dimension atomic force microscopy
N. Orji, R. Dixson, A. Vladár, M. Postek
2011NanoScience + Engineering14 citations
Semantic Scholar
NIST-TAPPI Workshop on Measurement Needs for Cellulose Nanomaterial
C. Davis, R. Moon, Sean Ireland, L. Johnston +7 more
201510 citations Open access
Semantic Scholar
Nanomanufacturing concerns about measurements made in the SEM Part III: vibration and drift
M. Postek, A. Vladár, P. Čižmár
2014Optics & Photonics - NanoScience + Engineering9 citations
Semantic Scholar
Production and Applications of Cellulose Nanomaterials | NIST
M. Postek, R. Moon, A. Rudie, M. Bilodeau
20139 citations
Semantic Scholar
Does your SEM really tell the truth?
M. Postek, A. Vladár
2012Defense + Commercial Sensing9 citations
Semantic Scholar
Contour metrology using critical dimension atomic force microscopy
N. Orji, R. Dixson, A. Vladár, B. Ming +1 more
2012Advanced Lithography8 citations
Semantic Scholar
Advances in modeling of scanning charged-particle-microscopy images
P. Čižmár, A. Vladár, M. Postek
2010Scanning Microscopies8 citations Open access
Semantic Scholar
Front Matter: Volume 8819
M. Postek, N. Orji
2013Optics & Photonics - NanoScience + Engineering7 citations Open access
Semantic Scholar
Advanced image composition with intra-frame drift correction
P. Čižmár, A. Vladár, M. Postek
2011Defense + Commercial Sensing7 citations
Semantic Scholar
Recent progress in understanding the imaging and metrology using the helium ion microscope
M. Postek, A. Vladár, B. Ming
2009Scanning Microscopies7 citations
Semantic Scholar
Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Aging
M. Kombolias, J. Obrzut, M. Postek, D. Poster +1 more
2019Analytical Letters6 citations Open access
Semantic Scholar
Front Matter: Volume 8036
M. Postek, D. Newbury, S. Platek, D. Joy +1 more
2011Defense + Commercial Sensing6 citations Open access
Semantic Scholar
Sustainable, renewable nanomaterials may replace carbon nanotubes
M. Postek, E. Brown
20096 citations
Semantic Scholar
Models for an Ultraviolet-C Research and Development Consortium
D. Poster, M. Postek, Y. Obeng, J. Kasianowicz +4 more
2022Journal of Research of the National Institute of Standards and Technology5 citations Open access
Semantic Scholar
Broadband Dielectric Spectroscopy as a Potential Label-Free Method to Rapidly Verify Ultraviolet-C Radiation Disinfection
Y. Obeng, B. J. Nablo, Darwin R. Reyes, D. Poster +1 more
2021Journal of Research of the National Institute of Standards and Technology5 citations Open access
Semantic Scholar
Ultra-low landing energy scanning electron microscopy for nanoengineering applications and metrology
M. Postek, A. Vladár, D. Poster, A. Muto +1 more
2020NanoScience + Engineering5 citations
Semantic Scholar
The Scanning Electron Microscope
A. Vladár, M. Postek
20175 citations
Semantic Scholar
Contour metrology using critical dimension atomic force microscopy
N. Orji, R. Dixson, B. Ng, A. Vladár +1 more
20165 citations
Semantic Scholar
Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation
M. Postek, A. Vladár
2015SPIE NanoScience + Engineering5 citations Open access
Semantic Scholar
10 nm Three-Dimensional CD-SEM Metrology | NIST
A. Vladár, J. Villarrubia, B. Ming, R. J. Kline +3 more
20145 citations
Semantic Scholar
Documentation for Reference Material (RM) 8820: A Versatile, Multipurpose Dimensional Metrology Calibration Standard for Scanned Particle Beam, Scanned Probe and Optical Microscopy
M. Postek, A. Vladár, B. Ming, Bunday Benjamin
20145 citations
Semantic Scholar
Nanomanufacturing
M. Postek
2020Definitions4 citations Open access
Semantic Scholar
Dielectric spectroscopic studies of biological material evolution and application to paper
M. Kombolias, J. Obrzut, Karl Montgomery, M. Postek +2 more
2018TAPPI Journal4 citations Open access
Semantic Scholar
Real-Time Image Composition with Correction of Drift Distortion
P. Čižmár, A. Vladár, M. Postek
20094 citations
Semantic Scholar
Front Matter: Volume 7405
M. Postek, J. Allgair
2009NanoScience + Engineering4 citations Open access
Semantic Scholar
Update on Bio-Refining and Nanocellulose Composite Materials Manufacturing
M. Postek, D. Poster
2017NanoScience + Engineering3 citations Open access
Semantic Scholar
Front Matter: Volume 9236
M. Postek, D. Newbury, S. Platek, T. Maugel
2014Other Conferences3 citations Open access
Semantic Scholar
Does your SEM really tell the truth? Part 2
M. Postek, A. Vladár, K. P. Purushotham
2013Defense, Security, and Sensing3 citations Open access
Semantic Scholar
Nanomanufacturing concerns about measurements made in the SEM II: specimen contamination
M. Postek, A. Vladár, K. P. Purushotham
2013Optics & Photonics - NanoScience + Engineering3 citations
Semantic Scholar

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