G. Medeiros

Most-cited papers

Device-Aware Test: A New Test Approach Towards DPPB Level
M. Fieback, Lizhou Wu, G. Medeiros, H. Aziza +4 more
2019International Test Conference52 citations Open access
Semantic Scholar
Defects, Fault Modeling, and Test Development Framework for RRAMs
M. Fieback, G. Medeiros, Lizhou Wu, H. Aziza +3 more
2022ACM Journal on Emerging Technologies in Computing Systems49 citations Open access
Semantic Scholar
Defect and Fault Modeling Framework for STT-MRAM Testing
Lizhou Wu, S. Rao, M. Taouil, G. Medeiros +4 more
2021IEEE Transactions on Emerging Topics in Computing28 citations Open access
Semantic Scholar
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing
Lizhou Wu, S. Rao, G. Medeiros, M. Taouil +5 more
2019IEEE European Test Symposium27 citations
Semantic Scholar
Intermittent Undefined State Fault in RRAMs
M. Fieback, G. Medeiros, A. Gebregiorgis, H. Aziza +2 more
2021IEEE European Test Symposium24 citations Open access
Semantic Scholar
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits
M. Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov +8 more
2016Journal of electronic testing20 citations Open access
Semantic Scholar
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs
G. Medeiros, M. Taouil, M. Fieback, L. Poehls +1 more
2019IEEE European Test Symposium15 citations Open access
Semantic Scholar
Analyzing the behavior of FinFET SRAMs with resistive defects
Thiago Santos Copetti, T. Balen, G. Medeiros, Leticia M. B. Poehls
2017IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chip15 citations
Semantic Scholar
Hard-to-Detect Fault Analysis in FinFET SRAMs
G. Medeiros, M. Fieback, Lizhou Wu, M. Taouil +2 more
2021IEEE Transactions on Very Large Scale Integration (vlsi) Systems12 citations Open access
Semantic Scholar
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
M. Fieback, Christopher Münch, A. Gebregiorgis, G. Medeiros +3 more
2022IEEE European Test Symposium9 citations Open access
Semantic Scholar
A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs
G. Medeiros, L. B. Bolzani Poehls, M. Taouil, F. Vargas +1 more
2018Microelectronics and reliability8 citations Open access
Semantic Scholar
Analyzing NBTI impact on SRAMs with resistive-open defects
M. Martins, G. Medeiros, T. Copetti, F. Vargas +1 more
2016Latin American Test Symposium8 citations
Semantic Scholar
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs
G. Medeiros, E. Brum, L. Poehls, Thiago Santos Copetti +1 more
2018Latin American Test Symposium7 citations
Semantic Scholar
Gate-level modelling of NBTI-induced delays under process variations
Thiago Santos Copetti, G. Medeiros, L. Poehls, F. Vargas +4 more
2016Latin American Test Symposium6 citations
Semantic Scholar
Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects
G. Medeiros, L. Poehls, F. Vargas
2016International Conference on VLSI Design6 citations
Semantic Scholar
Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects
Thiago Santos Copetti, G. Medeiros, M. Taouil, S. Hamdioui +2 more
2020Latin American Test Symposium5 citations Open access
Semantic Scholar
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs
G. Medeiros, Cemil Cem Gürsoy, Lizhou Wu, M. Fieback +3 more
2020Design, Automation and Test in Europe5 citations Open access
Semantic Scholar
NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits’ Life Time
Thiago Santos Copetti, G. Medeiros, L. Poehls, F. Vargas
2016Journal of electronic testing5 citations
Semantic Scholar
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs
G. Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil +2 more
2021IEEE European Test Symposium4 citations Open access
Semantic Scholar
Modeling Soft-Error Reliability Under Variability
A. Balakrishnan, G. Medeiros, C. C. Gürsoy, S. Hamdioui +2 more
2021IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems4 citations Open access
Semantic Scholar
Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects
G. Medeiros, E. Brum, L. Poehls, Thiago Santos Copetti +1 more
2019Journal of electronic testing3 citations
Semantic Scholar
Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs
Thiago Santos Copetti, G. Medeiros, Letícia M. B. Poehls, T. Balen
2017IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chip3 citations Open access
Semantic Scholar
Analysing NBTI Impact on SRAMs with Resistive Defects
M. Martins, G. Medeiros, T. Copetti, F. Vargas +1 more
2017Journal of electronic testing3 citations
Semantic Scholar
Improving the Detection of Undefined State Faults in FinFET SRAMs
G. Medeiros, M. Fieback, Thiago Santos Copetti, A. Gebregiorgis +3 more
2021International Conference on Design & Technology of Integrated Systems in Nanoscale Era2 citations Open access
Semantic Scholar
Development of a test methodology for FinFET-Based SRAMs
G. Medeiros
20172 citations
Semantic Scholar
RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems Design
C. C. Gürsoy, G. Medeiros, J. Chen, N. George +30 more
20191 citations
Semantic Scholar
NBTI-aware design of integrated circuits: a hardware-based approach
Thiago Santos Copetti, G. Medeiros, L. B. Bolzani Poehls, F. Vargas
2015Latin American Test Symposium1 citations
Semantic Scholar
Hierarchical Memory Diagnosis
G. Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil +2 more
2022IEEE European Test Symposium0 citations Open access
Semantic Scholar
2021 JETTA-TTTC Best Paper Award
Thiago Santos Copetti, G. Medeiros, M. Taouil, S. Hamdioui +3 more
2022Journal of electronic testing0 citations
Semantic Scholar
UB09 Session 9
W. Tiberti, Luigiaurelio Pomante, C. C. Gürsoy, G. Medeiros +24 more
20190 citations
Semantic Scholar
A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects
G. Pinto, G. Medeiros, F. Vargas, L. Poehls
2018Latin American Test Symposium0 citations
Semantic Scholar
Session 3 Fault Tolerance in SoCs and NoCs
G. Medeiros, L. Bolzani, F. Vargas, Sergei Kostin +6 more
20160 citations
Semantic Scholar