M. Tsukuda

Most-cited papers

General-Purpose Clocked Gate Driver IC With Programmable 63-Level Drivability to Optimize Overshoot and Energy Loss in Switching by a Simulated Annealing Algorithm
Koutaro Miyazaki, S. Abe, M. Tsukuda, I. Omura +3 more
2017IEEE transactions on industry applications109 citations
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Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules
M. Tsukuda, M. Koga, K. Nakashima, I. Omura
2016Microelectronics and reliability40 citations Open access
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General-purpose clocked gate driver (CGD) IC with programmable 63-level drivability to reduce Ic overshoot and switching loss of various power transistors
Koutaro Miyazaki, S. Abe, M. Tsukuda, I. Omura +3 more
2016Applied Power Electronics Conference33 citations
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Application-specific micro Rogowski coil for power modules - Design tool, novel coil pattern and demonstration
M. Koga, M. Tsukuda, K. Nakashima, I. Omura
201631 citations
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Critical IGBT Design Regarding EMI and Switching Losses
M. Tsukuda, Ichiro Omura, Yoko Sakiyama, Masakazu Yamaguchi +2 more
2008International Symposium on Power Semiconductor Devices and IC's29 citations
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A New Output Current Measurement Method With Tiny PCB Sensors Capable of Being Embedded in an IGBT Module
K. Hasegawa, S. Takahara, Shoji Tabata, M. Tsukuda +1 more
2017IEEE transactions on power electronics28 citations Open access
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Demonstration of 1200V Scaled IGBTs Driven by 5V Gate Voltage with Superiorly Low Switching Loss
T. Saraya, K. Itou, T. Takakura, M. Fukui +19 more
2018International Electron Devices Meeting24 citations
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Short-circuit protection for an IGBT with detecting the gate voltage and gate charge
K. Hasegawa, Kenichi Yamamoto, H. Yoshida, Kota Hamada +2 more
2014Microelectronics and reliability22 citations Open access
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High Power Density Converter using SiC-SBD
Ichiro Omura, M. Tsukuda, Wataru Saito, Tomokazu Domon
20072007 Power Conversion Conference - Nagoya22 citations
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3.3 kV Back-Gate-Controlled IGBT (BC-IGBT) Using Manufacturable Double-Side Process Technology
T. Saraya, K. Itou, T. Takakura, M. Fukui +15 more
2020International Electron Devices Meeting16 citations
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Bonding wire current measurement with tiny film current sensors
Hidetoshi Hirai, Yuya Kasho, M. Tsukuda, I. Omura
2012International Symposium on Power Semiconductor Devices and IC's16 citations Open access
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Universal trench edge termination design
Kota Seto, Ryu Kamibaba, M. Tsukuda, I. Omura
2012International Symposium on Power Semiconductor Devices and IC's15 citations Open access
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Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part I
Junpei Takaishi, Syohei Harada, M. Tsukuda, I. Omura
2011Microelectronics and reliability14 citations Open access
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Dynamic punch-through design of high-voltage diode for suppression of waveform oscillation and switching loss
M. Tsukuda, Yoko Sakiyama, Hideaki Ninomiya, M. Yamaguchi
2009International Symposium on Power Semiconductor Devices and IC's12 citations
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New anode design concept of 600V thin wafer PT-IGBT with very low dose p-buffer and transparent p-emitter
T. Matsudai, M. Tsukuda, S. Umekawa, Masahiro Tanaka +1 more
2003ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings.12 citations
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V-I Curve Based Condition Monitoring System for Power Devices
M. Tsukuda, L. Guan, Kazuha Watanabe, H. Yamaguchi +2 more
2020International Symposium on Power Semiconductor Devices and IC's11 citations Open access
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4.5 kV high-speed and rugged planar diode with novel carrier distribution control
Ken-ichi Matsushita, Takashi Shinohe, M. Tsukuda, Yoshihiro Minami +3 more
1998Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212)11 citations
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Development of fast short-circuit protection system for advanced IGBT
M. Ichiki, T. Arimoto, S. Abe, M. Tsukuda +1 more
2019Microelectronics and reliability10 citations
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Real-time failure monitoring system for high power IGBT under acceleration test up to 500 A stress
A. Watanabe, I. Omura, M. Tsukuda
2014International Symposium on Power Semiconductor Devices and IC's10 citations Open access
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Tiny-scale "stealth" current sensor to probe power semiconductor device failure
Y. Kasho, Hidetoshi Hirai, M. Tsukuda, I. Omura
2011Microelectronics and reliability10 citations Open access
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Peak minimisation based gate delay compensation for active current balancing of parallel IGBT system
R. Tripathi, M. Tsukuda, I. Omura
2019Microelectronics and reliability9 citations Open access
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Demonstration of 1200V Scaled IGBTs Driven by 5V Gate Voltage with Superiorly Low Switching Loss
Saraya Takuya, K. Itou, Toshihiko Takakura, Munetoshi Fukui +19 more
20199 citations
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IGBT avalanche current filamentaion ratio: Precise simulations on mesh and structure effect
Yuji Shiba, I. Omura, M. Tsukuda
2016International Symposium on Power Semiconductor Devices and IC's9 citations Open access
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Numerical study on the suppression of 4H-SiC PiN diodes forward bias degradation due to substrate basal plane dislocations
S. Torimi, Y. Obiyama, M. Tsukuda, I. Omura
20208 citations Open access
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Output-Current Measurement of a PWM Inverter with a Tiny PCB Rogowski Sensor Integrated into an IGBT Module
K. Hasegawa, Shun Sho, M. Tsukuda, I. Omura +2 more
2019European Conference on Cognitive Ergonomics8 citations Open access
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Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications
S. Abe, K. Hasegawa, M. Tsukuda, K. Wada +2 more
2017Microelectronics and reliability8 citations Open access
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Failure analysis of power devices based on real-time monitoring
A. Watanabe, M. Tsukuda, I. Omura
2015Microelectronics and reliability8 citations Open access
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Real time degradation monitoring system for high power IGBT module under power cycling test
A. Watanabe, M. Tsukuda, I. Omura
2013Microelectronics and reliability8 citations Open access
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Analog Basis, Low-Cost Inverter Output Current Sensing with Tiny PCB Coil Implemented inside IPM
Battuvshin Bayarkhuu, Bat-Otgon Bat-Ochir, K. Hasegawa, M. Tsukuda +2 more
2019International Symposium on Power Semiconductor Devices and IC's7 citations Open access
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3300V Scaled IGBTs Driven by 5V Gate Voltage
T. Saraya, K. Itou, T. Takakura, M. Fukui +20 more
2019International Symposium on Power Semiconductor Devices and IC's7 citations
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16-Channel micro magnetic flux sensor array for IGBT current distribution measurement
H. Tomonaga, M. Tsukuda, Seiichi Okoda, R. Noda +2 more
2015Microelectronics and reliability7 citations Open access
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Sub-micron junction termination for 1200V class devices toward CMOS process compatibility
Kota Seto, Junpei Takaishi, Hironori Imaki, Masahiro Tanaka +2 more
2013International Symposium on Power Semiconductor Devices and IC's7 citations Open access
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Demonstration of High Output Power Density (50 W/cc) Converter using 600 V SJ-MOSFET and SiC-SBD
M. Tsukuda, I. Omura, W. Saito, T. Domon
20067 citations
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High-throughput DBC-assembled IGBT screening for power module
M. Tsukuda, S. Okoda, R. Noda, K. Tashiro +1 more
20146 citations
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New power module integrating output current measurement function
S. Tabata, K. Hasegawa, M. Tsukuda, I. Omura
2017International Symposium on Power Semiconductor Devices and IC's5 citations Open access
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Optimal double sided gate control of IGBT for lower turn-off loss and surge voltage suppression
S. Harada, M. Tsukuda, I. Omura
20165 citations
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Ultra-fast lateral 600 V silicon PiN diode superior to SiC-SBD
M. Tsukuda, Hironori Imaki, I. Omura
2014International Symposium on Power Semiconductor Devices and IC's5 citations Open access
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High speed turn-on gate driving for 4.5kV IEGT without increase in PiN diode recovery current
Yamato Miki, M. Mukunoki, Takashi Matsuyoshi, M. Tsukuda +1 more
2013International Symposium on Power Semiconductor Devices and IC's5 citations Open access
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"Design for EMI" approach on power PiN diode reverse recovery
M. Tsukuda, K. Kawakami, Kenichi Takahama, I. Omura
2011Microelectronics and reliability5 citations
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New anode design concept of 600V thin wafer PT-IGBT with very low dose P-buffer and transparent P-emitter design concept of 600 V thin wafer PT-IGBT with very low dose P-buffer and transparent P-emitter
T. Matsudai, M. Tsukuda, S. Umekawa, Masahiro Tanaka +1 more
20045 citations
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Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction
K. Hasegawa, S. Abe, M. Tsukuda, I. Omura +1 more
20204 citations Open access
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Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
M. Tsukuda, S. Abe, K. Hasegawa, T. Ninomiya +1 more
2018Microelectronics and reliability4 citations Open access
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Magnetic flux signal simulation with 16-channel sensor array to specify accurate IGBT current distribution
M. Tsukuda, K. Matsuo, H. Tomonaga, S. Okoda +3 more
20164 citations
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Ultrafast lateral 600 V silicon SOI PiN diode with geometric traps for preventing waveform oscillation
M. Tsukuda, Hironori Imaki, I. Omura
20154 citations Open access
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A 600V Deep-Implanted Gate Vertical JFET
M. Mizukami, O. Takikawa, M. Murooka, S. Imai +6 more
20044 citations Open access
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A fully digital feedback control of gate driver for current balancing of parallel connected power devices
R. Tripathi, M. Tsukuda, I. Omura
2018Microelectronics and reliability3 citations Open access
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Novel 600 V low reverse recovery loss vertical PiN diode with hole pockets by Bosch deep trench
M. Tsukuda, A. Baba, Yuji Shiba, I. Omura
2016International Symposium on Power Semiconductor Devices and IC's3 citations Open access
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A testing method for evaluating shoot-through immunity of IGBTs in an inverter
K. Hasegawa, S. Abe, M. Tsukuda, I. Omura +1 more
2021Microelectronics and reliability2 citations Open access
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Benchmarking of Digital Gate Driven IGBTs: New Eoff-Vsurge Trade-off Approach
Kouji Harasaki, M. Tsukuda, I. Omura
2021International Symposium on Power Semiconductor Devices and IC's2 citations Open access
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Numerical Study of 4H-SiC PiN Diode to Enable Forward Bias Degradation Prediction Considering BPD-TED Conversion Position in the SiC Epitaxial Wafer
S. Torimi, Y. Obiyama, M. Tsukuda, I. Omura
2019Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials2 citations Open access
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