Skip to content

Home Search Authors Pakistan News Saved

SciRah

SciRah does not host or store research papers. Results come live from free, official scholarly APIs, and every paper links back to its original source.

Data sources

OpenAlex
Semantic Scholar
Crossref
CORE
arXiv
PubMed

Privacy policy Terms of service

Keonsoo Kim · SciRah

Researcher profile · Semantic Scholar

Keonsoo Kim

Share profile

Keonsoo Kim — researcher profile on SciRah

h-index: 12
Works: 20
Citations: 522

Most-cited papers

Extended scalability of perpendicular STT-MRAM towards sub-20nm MTJ node
Woojin Kim, Jae-Hun Jeong, Young-Wug Kim, W. Lim +17 more
2011International Electron Devices Meeting96 citations
Semantic Scholar
Impact of floating gate dry etching on erase characteristics in NOR flash memory
Woung-Moo Lee, Dong-Kyu Lee, Young-Ho Na, Keonsoo Kim +3 more
2002IEEE Electron Device Letters83 citations
Semantic Scholar
Direct Field Effect of Neighboring Cell Transistor on Cell-to-Cell Interference of nand Flash Cell Arrays
Mincheol Park, Keonsoo Kim, Jong-Ho Park, Jeongmin Choi
2009IEEE Electron Device Letters51 citations
Semantic Scholar
Enhancement of data retention and write current scaling for sub-20nm STT-MRAM by utilizing dual interfaces for perpendicular magnetic anisotropy
Jeong-Heon Park, Y. Kim, W. Lim, Jedon D. Kim +18 more
2012Symposium on VLSI Technology50 citations
Semantic Scholar
Integration Technology of 30nm Generation Multi-Level NAND Flash for 64Gb NAND Flash Memory
D. Kwak, Jae-Kwan Park, Keonsoo Kim, Yongsik Yim +24 more
20072007 IEEE Symposium on VLSI Technology39 citations
Semantic Scholar
Direct Field Effect of Neighboring Cell Transistor on Cell-to-Cell Interference of nand Flash Cell Arrays
Mincheol Park, Keonsoo Kim, Jong-Ho Park, Jeongmin Choi
200937 citations
Semantic Scholar
The Effect of Trapped Charge Distributions on Data Retention Characteristics of nand Flash Memory Cells
Munui Park, K. Suh, Keonsoo Kim, Sunghoi Hur +2 more
2007IEEE Electron Device Letters31 citations
Semantic Scholar
A 7MB/s 64Gb 3-bit/cell DDR NAND flash memory in 20nm-node technology
Ki-Tae Park, Oh-Suk Kwon, Sangyong Yoon, Myung-Hoon Choi +25 more
2011IEEE International Solid-State Circuits Conference30 citations
Semantic Scholar
The Effect of Negative $V_{\rm TH}$ of nand Flash Memory Cells on Data Retention Characteristics
Mun-Soo Park, E. Ahn, E. Cho, Keonsoo Kim +1 more
2009IEEE Electron Device Letters23 citations
Semantic Scholar
Effects of Plasma Process Induced Damages on Organic Gate Dielectrics of Organic Thin-Film Transistors
D. Kim, Dong-Woo Kim, Keonsoo Kim, Hyoung-Jin Kim +7 more
200823 citations Open access
Semantic Scholar
A highly manufacturable integration technology for 27nm 2 and 3bit/cell NAND flash memory
Choong-ho Lee, Suk-Kang Sung, Donghoon Jang, Sehoon Lee +16 more
2010International Electron Devices Meeting21 citations
Semantic Scholar
The Effect of Field Oxide Recess on Cell $V_{\rm TH}$ Distribution of nand Flash Cell Arrays
Mincheol Park, C. Lee, Sunghoi Hur, Keonsoo Kim +1 more
2008IEEE Electron Device Letters13 citations
Semantic Scholar
Mobile ion-induced data retention failure in NOR flash memory cell
Woung-Moo Lee, Dong-Kyu Lee, Keonsoo Kim, K. Ahn +1 more
200112 citations
Semantic Scholar
Investigation on the Retention Reliability of Scaled $ \hbox{SiO}_{2}/\hbox{Al}_{x}\hbox{O}_{y}/\hbox{SiO}_{2}$ Inter-Poly Dielectrics for nand Flash Cell Arrays
Se-Hoon Lee, Mincheol Park, Byung Yong Choi, Suk-Kang Sung +7 more
2010IEEE Electron Device Letters4 citations
Semantic Scholar
New Source/Drain Hot Carrier Injection Disturbance of NAND Flash Devices
Byung Yong Choi, Suk-Kang Sung, Sejun Park, Tae Hun Kim +12 more
20103 citations
Semantic Scholar
Influence of plasma edge damage on erase characteristics of NOR flash EEPROM using channel erase method
Dong-Kyu Lee, Woung-Moo Lee, Young-Ho Na, Keonsoo Kim +3 more
20022002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320)3 citations
Semantic Scholar
Data retention failure in NOR flash memory cells
Woung-Moo Lee, Dong-Kyu Lee, Y. Park, Keonsoo Kim +2 more
20012001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167)3 citations
Semantic Scholar
Enhancement of switching margin by utilizing superior pinned layer stability for sub-20nm perpendicular STT-MRAM
W. Lim, Yong-Jun Lee, J. Lee, W. Kim +21 more
2013Symposium on VLSI Technology0 citations
Semantic Scholar
A study on the electrical properties of plasma nitrided oxide gate dielectric in flash memory
Mincheol Park, Seung-Chul Lee, Keonsoo Kim, K. Suh
20070 citations Open access
Semantic Scholar
Production method and structure of a non-volatile semiconductor memory device having a memory cell array and a peripheral circuit
Jeong-Hyeok Choi, Keonsoo Kim
19910 citations
Semantic Scholar

Frequent co-authors

Invite them to SciRah by sharing their profile.

K. Suh×7
Invite
K. Suh — researcher profile on SciRah
Mincheol Park×7
Invite
Mincheol Park — researcher profile on SciRah
Woung-Moo Lee×4
Invite
Woung-Moo Lee — researcher profile on SciRah
Dong-Kyu Lee×4
Invite
Dong-Kyu Lee — researcher profile on SciRah

×4

Invite

K. Ahn — researcher profile on SciRah

Invite

W. Lim — researcher profile on SciRah

Invite

Seunghee Oh — researcher profile on SciRah

Invite

Kinam Kim — researcher profile on SciRah

Choong-ho Lee×3

Invite

Choong-ho Lee — researcher profile on SciRah

Jung-Dal Choi×3

Invite

Jung-Dal Choi — researcher profile on SciRah

Invite

Jusik Kim — researcher profile on SciRah

Joon-Min Park×2

Invite

Joon-Min Park — researcher profile on SciRah