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T. H. Both · SciRah

Researcher profile · Semantic Scholar

T. H. Both

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T. H. Both — researcher profile on SciRah

h-index: 7
Works: 29
Citations: 122

Most-cited papers

Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
F. Kastensmidt, Jorge Tonfat, T. H. Both, P. Rech +6 more
2014Microelectronics and reliability21 citations Open access
Semantic Scholar
Modeling and simulation of the charge trapping component of BTI and RTS
T. H. Both, G. F. Furtado, G. Wirth
2018Microelectronics and reliability16 citations
Semantic Scholar
Random Telegraph Noise Modeling for Circuit Analysis: RTN in Ring Oscillators
M. B. da Silva, T. H. Both, G. Wirth
2022IEEE Journal of the Electron Devices Society11 citations Open access
Semantic Scholar
Statistical analysis of the impact of charge traps in p-type MOSFETs via particle-based Monte Carlo device simulations
A. Rossetto, V. Camargo, T. H. Both, D. Vasileska +1 more
2020Journal of Computational Electronics11 citations
Semantic Scholar
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library
P. Vaz, T. H. Both, F. Vidor, R. Brum +1 more
2018Journal of electronic testing10 citations
Semantic Scholar
The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory
E. C. F. Pereira, O. Gonçalez, R. G. Vaz, C. Federico +2 more
2014Latin American Test Workshop - LATW10 citations
Semantic Scholar
Autocorrelation Analysis as a Technique to Study Physical Mechanisms of MOSFET Low-Frequency Noise
T. H. Both, J. Croon, Maurício Banaszeski da Silva, H. Tuinhout +3 more
2017IEEE Transactions on Electron Devices9 citations
Semantic Scholar
An Overview on Statistical Modeling of Random Telegraph Noise in the Frequency Domain
T. H. Both, M. B. da Silva, G. Wirth, H. Tuinhout +3 more
20205 citations
Semantic Scholar
TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm
P. Vaz, G. Wirth, F. Vidor, T. H. Both
2020Microelectronics Journal4 citations
Semantic Scholar
Analysing the Impact of Aging and Voltage Scaling under Neutron-induced Soft Error Rate in SRAM-based FPGAs
F. Kastensmidt, Tonfat Jorge, T. H. Both, P. Rech +6 more
20144 citations
Semantic Scholar
Unified Compact Modeling of Charge Trapping in 1/f Noise, RTN and BTI
G. Wirth, M. B. da Silva, T. H. Both
2021IEEE Electron Devices Technology and Manufacturing Conference3 citations
Semantic Scholar
A Compact Statistical Model for the Low-Frequency Noise in Halo-Implanted MOSFETs: Large RTN Induced by Halo Implants
Maurício Banaszeski da Silva, T. H. Both, H. Tuinhout, Adrie Zegers-van Duijnhoven +2 more
2019IEEE Transactions on Electron Devices3 citations
Semantic Scholar
A compact model for BTI simulation under cyclo-stationary conditions
T. H. Both, G. F. Furtado, G. Wirth
2017Symposium on Microelectronics Technology and Devices2 citations
Semantic Scholar
Deterministic Methodology for Electrical Simulation of BTI Induced Pulse Broadening
Gabriela Firpo Furtado, T. H. Both, M. Vieira, G. Wirth
2017IEEE transactions on device and materials reliability2 citations
Semantic Scholar
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs
F. Kastensmidt, Jorge Tonfat, T. H. Both, P. Rech +6 more
2014IEEE European Test Symposium2 citations Open access
Semantic Scholar
Statistical Modeling of Timing Variability due to Random Telegraph Noise in Logic Gates
Gilson I. Wirth, T. H. Both, M. B. Silva, Léopold Van Brandt
2025Fluctuation and Noise Letters1 citations Open access
Semantic Scholar
An Analytical Gate Delay Variability Model for Low-Power and Low-Voltage Applications
Caroline P. Garcia, T. H. Both
2022Symposium on Microelectronics Technology and Devices1 citations
Semantic Scholar
Gate Delay Variability due to Random Telegraph Noise
R. Barbosa, T. H. Both, G. Wirth
2021Symposium on Microelectronics Technology and Devices1 citations
Semantic Scholar
Towards Unifying the Statistical Modeling of Charge Trapping in Time and Frequency Domain
G. Wirth, M. B. da Silva, T. H. Both
20212021 IEEE Latin America Electron Devices Conference (LAEDC)1 citations
Semantic Scholar
A variability-based analysis technique revealing physical mechanisms of MOSFET low-frequency noise
T. H. Both, J. Croon, M. B. da Silva, H. Tuinhout +3 more
2017International Conference on Microelectronic Test Structures1 citations
Semantic Scholar
1/f noise simulation in MOSFETs under cyclo-stationary conditions using SPICE simulator
T. H. Both, G. Wirth, D. Vasileska
20151 citations
Semantic Scholar
Measurements of radiation effects on a 4 Mb PSRAM memory
O. Gonçalez, E. C. F. Pereira, R. G. Vaz, M. A. Pereira +2 more
20141 citations
Semantic Scholar
Analysis of Total Ionizing Dose Effects on 0.13 µm Technology-Temperature-Compensated Voltage References
T. H. Both, Dalton Martini Colombo, Ricardo Vanni Dallasen, G. Wirth
20131 citations Open access
Semantic Scholar
A PLL for clock generation with automatic frequency control under TID effects
Ricardo Vanni Dallasen, G. Wirth, T. H. Both
2012Symposium on Integrated Circuits and Systems Design1 citations
Semantic Scholar
Analysis of Total Ionizing Dose Effects on a Pseudo-Static Random Access Memory (PSRAM)
T. H. Both, G. Wirth, E. C. F. Pereira, O. Gonçalez +3 more
20121 citations Open access
Semantic Scholar
Evaluation of Non-Series-Parallel Structures for BTI-Aware Automated Design Methodologies
Henrique Kessler, Plinio Finkenauer, T. H. Both, L. D. da Rosa +1 more
2020International Symposium on Circuits and Systems0 citations
Semantic Scholar
Autocorrelation analysis in frequency domain as a tool for MOSFET low frequency noise characterization
T. H. Both
20170 citations
Semantic Scholar
Deterministic methodology to evaluate BTI impact on logic gates propagation delay
G. F. Furtado, T. H. Both, G. Wirth
2017Symposium on Microelectronics Technology and Devices0 citations
Semantic Scholar
1/f noise simulation in MOSFETs under cyclo-stationary conditions using SPICE simulator
T. H. Both, G. Wirth, D. Vasileska
2014Journal of Computational Electronics0 citations
Semantic Scholar

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