Data dependence based testability transformation in automated test generation
B. Korel, M. Harman, S. Chung, P. Apirukvorapinit +2 more
2005IEEE International Symposium on Software Reliability Engineering35 citations
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B. Korel, M. Harman, S. Chung, P. Apirukvorapinit +2 more
Hyun-seok Min, S. Chung, Jin-Young Choi