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peixiong zhao · SciRah

Researcher profile · Semantic Scholar

peixiong zhao

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peixiong zhao — researcher profile on SciRah

h-index: 76
Works: 883
Citations: 23K

Most-cited papers

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes
D. Ball, J. M. Hutson, A. Javanainen, J. Lauenstein +8 more
2020IEEE Transactions on Nuclear Science132 citations
Semantic Scholar
Radiation Effects in AlGaN/GaN HEMTs
D. Fleetwood, En Zhang, peixiong zhao, S. Pantelides
2022IEEE Transactions on Nuclear Science90 citations
Semantic Scholar
Estimating Terrestrial Neutron-Induced SEB Cross Sections and FIT Rates for High-Voltage SiC Power MOSFETs
D. Ball, B. Sierawski, K. Galloway, Robert A. Johnson +7 more
2019IEEE Transactions on Nuclear Science56 citations Open access
Semantic Scholar
Atomic-displacement threshold energies and defect generation in irradiated β-Ga2O3: A first-principles investigation
B. Tuttle, N. Karom, A. O’Hara, peixiong zhao +1 more
2023Journal of Applied Physics53 citations
Semantic Scholar
Unifying Concepts for Ion-Induced Leakage Current Degradation in Silicon Carbide Schottky Power Diodes
Robert A. Johnson, A. Javanainen, A. Raman, P. Chakraborty +9 more
2020IEEE Transactions on Nuclear Science52 citations Open access
Semantic Scholar
Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs
D. Ball, K. Galloway, Robert A. Johnson, M. L. Alles +6 more
2021IEEE Transactions on Nuclear Science45 citations
Semantic Scholar
Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxide Schottky Diodes
R. Cadena, D. Ball, En Zhang, S. Islam +14 more
2023IEEE Transactions on Nuclear Science41 citations
Semantic Scholar
LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices
Arijit Sengupta, D. Ball, A. Sternberg, S. Islam +13 more
2024IEEE Transactions on Nuclear Science37 citations
Semantic Scholar
Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes
Arijit Sengupta, D. Ball, A. Witulski, En Zhang +10 more
2023IEEE Transactions on Nuclear Science36 citations
Semantic Scholar
Dose-Rate Dependence of the Total-Ionizing-Dose Response of GaN-Based HEMTs
R. Jiang, En Zhang, M. Mccurdy, Pengfei Wang +4 more
2019IEEE Transactions on Nuclear Science36 citations
Semantic Scholar
Single-Event Burnout in Vertical β-Ga₂O₃ Diodes With Pt/PtOₓ Schottky Contacts and High-k Field-Plate Dielectrics
S. Islam, A. Senarath, E. Farzana, D. Ball +8 more
2024IEEE Transactions on Nuclear Science30 citations
Semantic Scholar
Comparison of Total-Ionizing-Dose Effects in Bulk and SOI FinFETs at 90 and 295 K
T. Haeffner, R. Keller, R. Jiang, B. Sierawski +8 more
2019IEEE Transactions on Nuclear Science24 citations
Semantic Scholar
Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design
A. Senarath, S. Islam, Arijit Sengupta, M. Mccurdy +11 more
2024Applied Physics Letters23 citations Open access
Semantic Scholar
TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
S. Bonaldo, M. Gorchichko, En Zhang, Teng Ma +9 more
2022IEEE Transactions on Nuclear Science21 citations
Semantic Scholar
Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO2/HfO2 Gate Dielectrics
M. Gorchichko, D. Fleetwood, peixiong zhao, R. Reed +9 more
2020IEEE Transactions on Nuclear Science21 citations
Semantic Scholar
Inclusion of Radiation Environment Variability for Reliability Estimates for SiC Power MOSFETs
R. Austin, B. Sierawski, R. Reed, peixiong zhao +3 more
2020IEEE Transactions on Nuclear Science21 citations
Semantic Scholar
Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors
Rachel M. Brewer, En Zhang, M. Gorchichko, Peng-Fei Wang +8 more
2021IEEE Transactions on Nuclear Science20 citations
Semantic Scholar
Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory
E. Wilcox, M. Breeding, M. Casey, J. Pellish +3 more
2021IEEE Transactions on Nuclear Science19 citations
Semantic Scholar
Physical Model for SiC Power Device Heavy-Ion Burnout Based on Pre-Strike Depletion Capacitance Energy Storage
S. Kosier, Arijit Sengupta, D. Ball, J. M. Hutson +7 more
2025IEEE Transactions on Nuclear Science17 citations Open access
Semantic Scholar
Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices
D. Fleetwood, En Zhang, peixiong zhao, S. Pantelides +1 more
2024IEEE Transactions on Nuclear Science17 citations
Semantic Scholar
Worst-Case Bias for High Voltage, Elevated-Temperature Stress of AlGaN/GaN HEMTs
Peng-Fei Wang, X. Li, En Zhang, R. Jiang +5 more
2020IEEE transactions on device and materials reliability17 citations
Semantic Scholar
Analysis of Heavy-Ion-Induced Leakage Current in SiC Power Devices
Robert A. Johnson, A. Witulski, D. Ball, K. Galloway +6 more
2022IEEE Transactions on Nuclear Science16 citations Open access
Semantic Scholar
Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors
M. Gorchichko, En Zhang, Pan Wang, S. Bonaldo +5 more
2021IEEE Transactions on Nuclear Science16 citations
Semantic Scholar
Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO2/Al2O3 Dielectrics
S. Bonaldo, V. Putcha, D. Linten, S. Pantelides +11 more
2020IEEE Transactions on Nuclear Science16 citations
Semantic Scholar
Charge Transport in Vertical GaN Schottky Barrier Diodes: A Refined Physical Model for Conductive Dislocations
Lei-Lei Chen, peixiong zhao, D. Fleetwood, Hai Lu +8 more
2020IEEE Transactions on Electron Devices16 citations
Semantic Scholar
Low-frequency noise and defects in copper and ruthenium resistors
D. Fleetwood, S. Beyne, R. Jiang, S. E. Zhao +11 more
2019Applied Physics Letters15 citations Open access
Semantic Scholar
Electron Transport Properties of AlxGa1−xN/GaN Transistors Based on First-Principles Calculations and Boltzmann-Equation Monte Carlo Simulations
Jingtian Fang, M. Fischetti, peixiong zhao, R. Reed +2 more
2019Physical Review Applied15 citations
Semantic Scholar
Low-Frequency Noise Due to Iron Impurity Centers in GaN-Based HEMTs
D. Fleetwood, Xun Li, En Zhang, peixiong zhao +1 more
2024IEEE Transactions on Electron Devices14 citations
Semantic Scholar
Single-Event Transient Response of Vertical and Lateral Waveguide-Integrated Germanium Photodiodes
L. Ryder, K. Ryder, A. Sternberg, J. Kozub +7 more
2021IEEE Transactions on Nuclear Science14 citations Open access
Semantic Scholar
Single-Event Effects in Heavy-Ion Irradiated 3-kV SiC Charge-Balanced Power Devices
Arijit Sengupta, D. Ball, S. Islam, A. Senarath +13 more
2024IEEE Transactions on Nuclear Science12 citations Open access
Semantic Scholar
Defect and Impurity-Center Activation and Passivation in Irradiated AlGaN/GaN HEMTs
X. Li, P.-F. Wang, X. Zhao, H. Qiu +5 more
2024IEEE Transactions on Nuclear Science11 citations
Semantic Scholar
Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
Zixiang Guo, Kan Li, Xun Li, Xuyi Luo +7 more
2023IEEE Transactions on Nuclear Science11 citations
Semantic Scholar
Radiation-Induced Transient Response Mechanisms in Photonic Waveguides
L. Ryder, peixiong zhao, R. Reed, S. Weiss
2022IEEE Transactions on Nuclear Science11 citations
Semantic Scholar
Total-Ionizing-Dose Effects on 3D Sequentially Integrated, Fully Depleted Silicon-on-Insulator MOSFETs
Shintaro Toguchi, En Zhang, M. Gorchichko, D. Fleetwood +8 more
2020IEEE Electron Device Letters11 citations
Semantic Scholar
Low-frequency noise and defects in AlGaAs/InGaAs/GaAs pseudomorphic high-electron mobility transistors
X.-Y. Luo, A. O’Hara, X. Li, P.-F. Wang +4 more
2024Journal of Applied Physics10 citations Open access
Semantic Scholar
Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate
S. Islam, A. Senarath, Arijit Sengupta, En Zhang +7 more
2023Device Research Conference10 citations
Semantic Scholar
Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices
Jingchen Cao, Peng-Fei Wang, Xun Li, Zixiang Guo +10 more
2022IEEE Transactions on Nuclear Science10 citations
Semantic Scholar
Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
Kan Li, En Zhang, M. Gorchichko, Peng-Fei Wang +9 more
2021IEEE Transactions on Nuclear Science10 citations
Semantic Scholar
Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation
K. Ryder, L. Ryder, A. Sternberg, J. Kozub +15 more
2021IEEE Transactions on Nuclear Science10 citations Open access
Semantic Scholar
3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs
M. Reaz, Andrew M. Tonigan, Kan Li, M. B. Smith +15 more
2021IEEE Transactions on Electron Devices10 citations Open access
Semantic Scholar
New Insight into Single-Event Radiation Failure Mechanisms in Silicon Carbide Power Schottky Diodes and MOSFETs
A. Witulski, D. Ball, Robert A. Johnson, K. Galloway +11 more
202010 citations Open access
Semantic Scholar
The Impact of Proton-Induced Single Events on Image Classification in a Neuromorphic Computing Architecture
Rachel M. Brewer, R. Reed, S. Moran, Jonathan Cox +6 more
2020IEEE Transactions on Nuclear Science10 citations Open access
Semantic Scholar
Pulsed-Laser Induced Single-Event Transients in InGaAs FinFETs on Bulk Silicon Substrates
Hui-Qi Gong, K. Ni, En Zhang, A. Sternberg +8 more
2019IEEE Transactions on Nuclear Science10 citations
Semantic Scholar
Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology
Andrew M. Tonigan, D. Ball, G. Vizkelethy, J. Black +6 more
2021IEEE Transactions on Nuclear Science9 citations Open access
Semantic Scholar
Damage Separation in a Bipolar Junction Transistor Following Irradiation With 250-MeV Protons
S. C. Witczak, S. Messenger, D. Fleetwood, peixiong zhao +3 more
2019IEEE Transactions on Nuclear Science9 citations
Semantic Scholar
Comparison of Sensitive Volumes Associated With Ion- and Laser-Induced Charge Collection in an Epitaxial Silicon Diode
K. Ryder, Yuanfu Zhao, Liang Wang, Chuanmin Wang +12 more
2020IEEE Transactions on Nuclear Science8 citations Open access
Semantic Scholar
Total-Ionizing-Dose Effects on InGaAs FinFETs With Modified Gate-stack
Simeng E. Zhao, A. Paccagnella, peixiong zhao, R. Reed +9 more
2020IEEE Transactions on Nuclear Science8 citations
Semantic Scholar
Total-Ionizing-Dose Effects at Ultrahigh Doses in AlGaN/GaN HEMTs
S. Bonaldo, En Zhang, S. Mattiazzo, A. Paccagnella +3 more
2023IEEE Transactions on Nuclear Science7 citations Open access
Semantic Scholar
Polarization Dependence of Pulsed Laser-Induced SEEs in SOI FinFETs
L. Ryder, peixiong zhao, S. Weiss, R. Reed +8 more
2020IEEE Transactions on Nuclear Science7 citations
Semantic Scholar
Laser-Induced Single-Event Transients in Black Phosphorus MOSFETs
Chun-Dong Liang, R. Ma, K. Li, Y. Su +10 more
2019IEEE Transactions on Nuclear Science7 citations
Semantic Scholar

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