H. Kerkhoff

Most-cited papers

Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses
Shaji Krishnan, H. Kerkhoff
2013IEEE design & test27 citations
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Analysis and design of an on-chip retargeting engine for IEEE 1687 networks
Ahmed M. Y. Ibrahim, H. Kerkhoff
2016IEEE European Test Symposium24 citations
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CRISP: Cutting Edge Reconfigurable ICs for Stream Processing
T. Ahonen, Timon D. ter Braak, S. T. Burgess, R. Geissler +12 more
201122 citations
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Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor
H. Kerkhoff, Xiao Zhang
20102010 Fifth IEEE International Symposium on Electronic Design, Test & Applications18 citations Open access
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Simulating NBTI Degradation in Arbitrary Stressed Analog/ Mixed-Signal Environments
J. Wan, H. Kerkhoff, J. Bisschop
2016IEEE transactions on nanotechnology13 citations Open access
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iJTAG integration of complex digital embedded instruments
Ahmed M. Y. Ibrahim, H. Kerkhoff
2014International Design and Test Workshop/Symposium13 citations Open access
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Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs
J. Wan, H. Kerkhoff
2011International SoC Design Conference13 citations
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An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips
Ahmed M. Y. Ibrahim, H. Kerkhoff
2019International Test Conference in Asia12 citations Open access
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Online digital offset voltage compensation method for AMR sensors
Andreina Zambrano, H. Kerkhoff
20152015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings12 citations
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A Technique for Accelerating Injection of Transient Faults in Complex SoCs
Alireza Rohani, H. Kerkhoff
20112011 14th Euromicro Conference on Digital System Design12 citations
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The influence of No Fault Found in analogue CMOS circuits
J. Wan, H. Kerkhoff
201419th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings10 citations Open access
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A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing
Yong Zhao, H. Kerkhoff
2016International Conference on Design & Technology of Integrated Systems in Nanoscale Era9 citations Open access
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Intermittent Resistive Faults in Digital CMOS Circuits
H. Kerkhoff, Hassan Ebrahimi
20152015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems9 citations Open access
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Rapid transient fault insertion in large digital systems
Alireza Rohani, H. Kerkhoff
2013Microprocessors and microsystems9 citations
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A dependable AMR sensor system for automotive applications
Andreina Zambrano, H. Kerkhoff
2017International Test Conference in Asia8 citations
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Efficient utilization of hierarchical iJTAG networks for interrupts management
Ahmed M. Y. Ibrahim, H. Kerkhoff
2016IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems8 citations
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Determination of the drift of the maximum angle error in AMR sensors due to aging
Andreina Zambrano, H. Kerkhoff
20162016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)8 citations
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Highly Dependable Multi-processor SoCs Employing Lifetime Prediction Based on Health Monitors
Yong Zhao, H. Kerkhoff
2016Asian Test Symposium8 citations
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Unit-Based Functional IDDT Testing for Aging Degradation Monitoring in a VLIW Processor
Yong Zhao, H. Kerkhoff
20152015 Euromicro Conference on Digital System Design8 citations
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Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation
Yong Zhao, H. Kerkhoff
20142014 17th Euromicro Conference on Digital System Design8 citations
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Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks
Ahmed M. Y. Ibrahim, H. Kerkhoff, Abrar A. Ibrahim, M. Safar +1 more
2019IEEE VLSI Test Symposium7 citations
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Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation
Yong Zhao, H. Kerkhoff
2015International Conference on Design & Technology of Integrated Systems in Nanoscale Era7 citations
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Pulse-length determination techniques in the rectangular single event transient fault model
Alireza Rohani, H. Kerkhoff, Enrico Costenaro, D. Alexandrescu
2013International Conference / Workshop on Embedded Computer Systems: Architectures, Modeling and Simulation7 citations
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SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life
Muhammad Aamir Khan, H. Kerkhoff
2011IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems7 citations
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A system-level platform for dependability enhancement and its analysis for mixed-signal SoCs
Muhammad Aamir Khan, H. Kerkhoff
201114th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems7 citations
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Structured scan patterns retargeting for dynamic instruments access
Ahmed M. Y. Ibrahim, H. Kerkhoff
2017IEEE VLSI Test Symposium6 citations
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Investigation of Intermittent Resistive Faults in Digital CMOS Circuits
H. Kerkhoff, Hassan Ebrahimi
2016J. Circuits Syst. Comput.6 citations Open access
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Designing reliable cyber-physical systems overview associated to the special session at FDL'16
Gadi Aleksandrowicz, Eli Arbel, R. Bloem, T. T. ter Braak +16 more
2016Forum on Specification and Design Languages6 citations
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Accessing on-chip temperature health monitors using the IEEE 1687 standard
Ghazanfar Ali, A. Badawy, H. Kerkhoff
2016International Conference on Electronics, Circuits, and Systems6 citations
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Embedded instruments for enhancing dependability of analogue and mixed-signal IPs
J. Wan, H. Kerkhoff
2015IEEE International New Circuits and Systems Conference6 citations
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Linking aging measurements of health-monitors and specifications for multi-processor SoCs
H. Kerkhoff, J. Wan, Yong Zhao
2014International Conference on Design & Technology of Integrated Systems in Nanoscale Era6 citations
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The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits
V. Kerzérho, H. Kerkhoff, Gert-Jan Bollen, Y. Xing
20112011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop6 citations Open access
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IJTAG compatible analogue embedded instruments for MPSoC life-time prediction
J. Pathrose, Ghazanfar Ali, H. Kerkhoff
2018Latin American Test Symposium5 citations
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A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687
Ahmed M. Y. Ibrahim, H. Kerkhoff
2017IEEE International Symposium on On-Line Testing and Robust System Design5 citations
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Online digital compensation Method for AMR sensors
Andreina Zambrano, H. Kerkhoff
2016IEEE/IFIP International Conference on Very Large Scale Integration of System-on-Chip5 citations
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Detecting intermittent resistive faults in digital CMOS circuits
Hassan Ebrahimi, Alireza Rohani, H. Kerkhoff
2016IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems5 citations
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Fault-tolerant system for catastrophic faults in AMR sensors
Andreina Zambrano, H. Kerkhoff
2015IEEE International Symposium on On-Line Testing and Robust System Design5 citations
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Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard
H. Kerkhoff, Hassan Ebrahimi
2015Asia Symposium on Quality Electronic Design5 citations
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A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses
Shaji Krishnan, H. Kerkhoff
20112011 Sixteenth IEEE European Test Symposium5 citations
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A Dependability Solution for Homogeneous MPSoCs
Xiao Zhang, H. Kerkhoff
20112011 IEEE 17th Pacific Rim International Symposium on Dependable Computing5 citations Open access
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On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-Learning
Ghazanfar Ali, L. Bagheriye, H. Kerkhoff
2020International Symposium on Circuits and Systems4 citations
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IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation
Ghazanfar Ali, J. Pathrose, H. Kerkhoff
2019IEEE European Test Symposium4 citations
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IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time
Ghazanfar Ali, J. Pathrose, H. Kerkhoff
2019Latin American Test Symposium4 citations
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Thermal issues in test: An overview of the significant aspects and industrial practice
Juergen Alt, P. Bernardi, A. Bosio, R. Cantoro +8 more
2016IEEE VLSI Test Symposium4 citations
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Testing for Intermittent Resistive Faults in CMOS Integrated Systems
Hassan Ebrahimi, H. Kerkhoff
2016Euromicro Symposium on Digital Systems Design4 citations
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A software framework to calculate local temperatures in CMOS processors
Alireza Rohani, Hassan Ebrahimi, H. Kerkhoff
2016International Workshop on Power and Timing Modeling, Optimization and Simulation4 citations
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New drain current model for nano-meter MOS transistors on-chip threshold voltage test
J. Wan, H. Kerkhoff
2015IEEE European Test Symposium4 citations
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An embedded offset and gain instrument for OpAmp IPs
J. Wan, H. Kerkhoff
2014Design, Automation and Test in Europe4 citations
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Analysing degradation effects in charge-redistribution SAR ADCs
Muhammad Aamir Khan, H. Kerkhoff
2013IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems4 citations Open access
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Monitoring operating temperature and supply voltage in achieving high system dependability
Muhammad Aamir Khan, H. Kerkhoff
2013International Conference on Design & Technology of Integrated Systems in Nanoscale Era4 citations Open access
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